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References

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  1. O. Kafri, “Noncoherent Method of Mapping Phase Objects,” Opt. Lett. 5, 555 (1980).
    [CrossRef] [PubMed]
  2. E. Bar-Ziv, S. Sgulim, O. Kafri, E. Keren, “Temperature Mapping in Flames by Moire Deflectometry,” Appl. Opt. 22, 698 (1983).
    [CrossRef] [PubMed]
  3. J. Stricker, “Diffraction Effects and Special Advantages in Electronic Heterodyne Moire Deflectometry,” Appl. Opt. 25, 895 (1986).
    [CrossRef] [PubMed]
  4. A. J. Decker, J. Stricker, “A Comparison of Electronic Heterodyne Moire Deflectometry and Electronic Heterodyne Holographic Interferometry for Flow Measurements,” listed” in 1985 SAE Transactions as paper 851896 (Society of Automotive Engineers, Warrendale, PA 15096).
  5. J. Stricker, “Moire Deflectometry with Deferred Electronic Heterodyne Readout,” Appl. Opt. 24, 2298 (1985).
    [CrossRef] [PubMed]
  6. J. Stricker, “Electronic Heterodyne Readout of Fringes in Moire Deflectometry,” Opt. Lett. 10, 247 (1985).
    [CrossRef] [PubMed]

1986

1985

1983

1980

Bar-Ziv, E.

Decker, A. J.

A. J. Decker, J. Stricker, “A Comparison of Electronic Heterodyne Moire Deflectometry and Electronic Heterodyne Holographic Interferometry for Flow Measurements,” listed” in 1985 SAE Transactions as paper 851896 (Society of Automotive Engineers, Warrendale, PA 15096).

Kafri, O.

Keren, E.

Sgulim, S.

Stricker, J.

J. Stricker, “Diffraction Effects and Special Advantages in Electronic Heterodyne Moire Deflectometry,” Appl. Opt. 25, 895 (1986).
[CrossRef] [PubMed]

J. Stricker, “Moire Deflectometry with Deferred Electronic Heterodyne Readout,” Appl. Opt. 24, 2298 (1985).
[CrossRef] [PubMed]

J. Stricker, “Electronic Heterodyne Readout of Fringes in Moire Deflectometry,” Opt. Lett. 10, 247 (1985).
[CrossRef] [PubMed]

A. J. Decker, J. Stricker, “A Comparison of Electronic Heterodyne Moire Deflectometry and Electronic Heterodyne Holographic Interferometry for Flow Measurements,” listed” in 1985 SAE Transactions as paper 851896 (Society of Automotive Engineers, Warrendale, PA 15096).

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Figures (2)

Fig. 1
Fig. 1

(a) Schematic of a moire deflectometer with electronic heterodyne readout: R.S., T.S., and G.S. are the reference, test, and grating signals, respectively; S is a mat screen, G1 and G2 are the Ronchi gratings; ϕ is the deflection angle. (b) Moire fringe pattern formed by two Ronchi gratings.

Fig. 2
Fig. 2

Heterodyne scan of a moire fringe pattern parallel to unshifted fringes.

Equations (3)

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δ h y = ϕ x Δ θ .
ϕ x = 1 η e z 0 Z f n x d z ,
I T = [ R ( x ) Δ + R ( x ) ] ( 1 4 + 2 π 2 m = 0 cos { π ( 2 m + 1 ) 2 Δ * ( R ( x ) R ( x ) + Δ ) } ( 2 m + 1 ) 2 × cos { 2 π ( 2 m + 1 ) } [ χ p + y θ p + ϕ x ( r ) Δ p + A p cos ω t ] ) ,

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