Abstract

A new instrument for measuring the evolution of index profiles during diffusion in hot (500°C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 μm at 0.6471 μm and a phase resolution of λ/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.

© 1988 Optical Society of America

Gradient-index profile control from mixed molten salt baths

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