Abstract

The refractive index as a function of spatial coordinate in three Czochralski grown germanium–silicon alloy GRIN crystals has been measured using ac interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real-time data processing. The measured refractive-index profiles were compared to theoretical profiles which were calculated from a model based on the segregation effect of silicon in germanium.

© 1988 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |

  1. J. J. Miceli, “Infrared Gradient Index Optics: Materials, Fabrication and Testing,” Ph.D. Thesis, U. Rochester (1982).
  2. D. P. Naughton, “Fabrication and Testing of Gradient Index Materials,” M.S. Thesis, U. Rochester (1986).

Miceli, J. J.

J. J. Miceli, “Infrared Gradient Index Optics: Materials, Fabrication and Testing,” Ph.D. Thesis, U. Rochester (1982).

Naughton, D. P.

D. P. Naughton, “Fabrication and Testing of Gradient Index Materials,” M.S. Thesis, U. Rochester (1986).

Other (2)

J. J. Miceli, “Infrared Gradient Index Optics: Materials, Fabrication and Testing,” Ph.D. Thesis, U. Rochester (1982).

D. P. Naughton, “Fabrication and Testing of Gradient Index Materials,” M.S. Thesis, U. Rochester (1986).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Infrared ac harmonic interferometer.

Fig. 2
Fig. 2

Measured vs calculated refractive index; sample IR6.

Fig. 3
Fig. 3

Measured vs calculated refractive index; sample DN5.

Fig. 4
Fig. 4

Measured vs calculated refractive index; sample DN6.

Tables (1)

Tables Icon

Table I Crystal Growing Summary

Metrics