Abstract

We demonstrate an instrument which enables the combined operation of a moire deflectometer, Fizeau interferometer, and schlieren device. By using each mode separately, it is possible to compare the three methods, and by combined operation, to benefit from the advantages of each method.

© 1988 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. M. V. R. K. Murty, “Fizeau Interferometer,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 1.2.
  2. Zygo Corp., Photonics Handbook1987 (Lauren Publishing Corp., Pittsfield, MA), pp. H-296.
  3. J. Ojeda-Castaneda, “Foucault or Knife-Edge Test,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 8.2.
  4. O. Kafri, “Noncoherent Method for Phase Object Mapping,” Opt. Lett. 5, 555 (1980).
    [CrossRef] [PubMed]
  5. O. Kafri, I. Glatt, “Moire Deflectometry—A Ray Deflection Approach to Optical Testing,” Opt. Eng. 24, 944 (1985).
    [CrossRef]
  6. O. Kafri, I. Glatt, “High Sensitivity Reflection-Transmission Moire Deflectometer,” Appl. Opt. 27, 351 (1988).
    [CrossRef] [PubMed]
  7. N. Abramson, “The ‘Interferoscope,’ a New Type of Interferometer with Variable Fringe Separation,” Optik 30, 56 (1969).

1988

1985

O. Kafri, I. Glatt, “Moire Deflectometry—A Ray Deflection Approach to Optical Testing,” Opt. Eng. 24, 944 (1985).
[CrossRef]

1980

1969

N. Abramson, “The ‘Interferoscope,’ a New Type of Interferometer with Variable Fringe Separation,” Optik 30, 56 (1969).

Abramson, N.

N. Abramson, “The ‘Interferoscope,’ a New Type of Interferometer with Variable Fringe Separation,” Optik 30, 56 (1969).

Glatt, I.

O. Kafri, I. Glatt, “High Sensitivity Reflection-Transmission Moire Deflectometer,” Appl. Opt. 27, 351 (1988).
[CrossRef] [PubMed]

O. Kafri, I. Glatt, “Moire Deflectometry—A Ray Deflection Approach to Optical Testing,” Opt. Eng. 24, 944 (1985).
[CrossRef]

Kafri, O.

Murty, M. V. R. K.

M. V. R. K. Murty, “Fizeau Interferometer,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 1.2.

Ojeda-Castaneda, J.

J. Ojeda-Castaneda, “Foucault or Knife-Edge Test,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 8.2.

Appl. Opt.

Opt. Eng.

O. Kafri, I. Glatt, “Moire Deflectometry—A Ray Deflection Approach to Optical Testing,” Opt. Eng. 24, 944 (1985).
[CrossRef]

Opt. Lett.

Optik

N. Abramson, “The ‘Interferoscope,’ a New Type of Interferometer with Variable Fringe Separation,” Optik 30, 56 (1969).

Other

M. V. R. K. Murty, “Fizeau Interferometer,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 1.2.

Zygo Corp., Photonics Handbook1987 (Lauren Publishing Corp., Pittsfield, MA), pp. H-296.

J. Ojeda-Castaneda, “Foucault or Knife-Edge Test,” in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), Sec. 8.2.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (10)

Fig. 1
Fig. 1

Basic telescopic setup.

Fig. 2
Fig. 2

Fizeau interferometer setup. A partially transmittance reference plate is placed parallel to the test object so that the light reflected directly from the reference plate interferes with that reflected from the test object.

Fig. 3
Fig. 3

Fizeau interferogram of the reflective surface of a flat beam splitter.

Fig. 4
Fig. 4

Schlieren setup. A knife-edge spatial filter is placed at the focal plane of the small lens and cuts the Fourier transform of the object.

Fig. 5
Fig. 5

Schlieren photograph of the object of Fig. 3. Only the large positive gradients are darkened.

Fig. 6
Fig. 6

As the knife-edge is moved toward the focal point, some of the smaller positive slopes are also darkened.

Fig. 7
Fig. 7

Moire deflectometer setup. Two Ronchi ruling gratings are placed parallel to the second collimating lens separated by a distance d.

Fig. 8
Fig. 8

Infinite fringe moire deflectogram of the object shown in Fig. 3.

Fig. 9
Fig. 9

Finite fringe moire deflectogram of the same object. Note that the direction of the slope can be determined from the direction of the fringe distortion.

Fig. 10
Fig. 10

Combined operation of moire deflectometry and Fizeau interferometry. The large distortions that produce too many fringes with interferometry are mapped by deflectometry tuned to a low sensitivity.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

δ β x = p 2 d M ,
β x = h θ 2 d M .
δ β = λ / 4 π a ,
δ φ δ x λ / 2 π ,

Metrics