Abstract

An improved analytical method has been developed to extract the dissociation probability from the raw data in infrared multiphoton dissociation with a Gaussian-profile beam using a focused irradiation geometry. The conventional analytical method based on the power-law model is shown to overestimate the dissociation yield by as much as 60% compared with that predicted by the newly developed analytical method based on the cumulative log-normal distribution model. The obtained analytical solution is well fitted by simple algebraic expressions, which enable us to analyze the experimental data quickly and accurately without tedious iteration procedures.

© 1988 Optical Society of America

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