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  1. M. C. Gupta, “Optical Constant Determination of Thin Films,” Appl. Opt. 27, 954 (1988).
    [CrossRef] [PubMed]
  2. I. Ohlidal, K. Navratil, “Complete Optical Analysis of a Non-absorbing Thin Film on an Absorbing Substrate by a New Method of Immersion Spectroscopic Reflectometry,” Thin Solid Films 148, 17 (1987).
    [CrossRef]
  3. R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
    [CrossRef]

1988 (1)

1987 (1)

I. Ohlidal, K. Navratil, “Complete Optical Analysis of a Non-absorbing Thin Film on an Absorbing Substrate by a New Method of Immersion Spectroscopic Reflectometry,” Thin Solid Films 148, 17 (1987).
[CrossRef]

1986 (1)

R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
[CrossRef]

Gupta, M. C.

Lubinskaya, R. I.

R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
[CrossRef]

Mardezhov, A. S.

R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
[CrossRef]

Navratil, K.

I. Ohlidal, K. Navratil, “Complete Optical Analysis of a Non-absorbing Thin Film on an Absorbing Substrate by a New Method of Immersion Spectroscopic Reflectometry,” Thin Solid Films 148, 17 (1987).
[CrossRef]

Ohlidal, I.

I. Ohlidal, K. Navratil, “Complete Optical Analysis of a Non-absorbing Thin Film on an Absorbing Substrate by a New Method of Immersion Spectroscopic Reflectometry,” Thin Solid Films 148, 17 (1987).
[CrossRef]

Shvets, V. A.

R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
[CrossRef]

Svitashov, K. K.

R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
[CrossRef]

Appl. Opt. (1)

Surf. Sci. (1)

R. I. Lubinskaya, A. S. Mardezhov, K. K. Svitashov, V. A. Shvets, “Ellipsometric Analysis of Inhomogeneous Structures on the Basis of Complex Reflection Coefficients,” Surf. Sci. 177, 625 (1986).
[CrossRef]

Thin Solid Films (1)

I. Ohlidal, K. Navratil, “Complete Optical Analysis of a Non-absorbing Thin Film on an Absorbing Substrate by a New Method of Immersion Spectroscopic Reflectometry,” Thin Solid Films 148, 17 (1987).
[CrossRef]

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Equations (7)

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r A B = r A O + r O B 1 + r A O r O B ,
r 2 = r f + ( t f 2 - r f 2 ) r 1 1 + r f r 1 ,
R 1 = r 1 r 1 * ;
R 2 = r 2 r 2 * ,
A r 1 2 + B r 1 + C = 0 ,
A = r f * ( t f 2 - r f 2 ) + r f R 2 , B = r f r f * ( 1 - R 1 R 2 ) - ( t f 2 - r f 2 ) ( t f 2 - r f 2 ) * R 1 - R 2 , C = R 1 [ r f ( t f 2 - r f 2 ) * + r f * R 2 ] ,
r 1 = - B ± B 2 - 4 A C 2 A .

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