Abstract

A new moire deflectometer setup with a built-in telescope is proposed. This setup is equally suitable for measuring both phase objects and specular surfaces requiring only minor adjustments. The telescope-based design enables high-sensitivity testing of large optical components with a 2.54-cm (1-in.) aperture optical system.

© 1988 Optical Society of America

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References

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  1. O. Kafri, “Noncoherent Method for Mapping Phase Objects,” Opt. Lett. 5, 555 (1980).
    [Crossref] [PubMed]
  2. O. Kafri, A. Livnat, “Reflective Surface Analysis using Moire Deflectometry,” Appl. Opt. 20, 3098 (1981).
    [Crossref] [PubMed]
  3. O. Kafri, I. Glatt, “Moire Deflectometry—A Ray Deflection Approach to Optical Testing,” Opt. Eng. 24, 944 (1985).
    [Crossref]
  4. O. Kafri, J. Krasinski, “High-Sensitivity Moire Deflectometry Using a Telescope,” Appl. Opt. 24, 2746 (1985).
    [Crossref]
  5. J. Krasinski, D. F. Heller, O. Kafri, “Phase Object Microscopy Using Moire Deflectometry,” Appl. Opt. 24, 3032 (1985).
    [Crossref] [PubMed]

1985 (3)

1981 (1)

1980 (1)

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Figures (5)

Fig. 1
Fig. 1

Setup for ray deflection analysis of phase objects.

Fig. 2
Fig. 2

Setup for ray deflection analysis of specular objects.

Fig. 3
Fig. 3

High-sensitivity reflection transmission deflectometer.

Fig. 4
Fig. 4

Modified deflectometric setup for measuring curved mirror aberrations.

Fig. 5
Fig. 5

Moire deflectogram of a spherical mirror of 45-cm focal length measured with accuracy of 8 × 10−6 rad.

Equations (2)

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β = z θ / 2 Δ M ,
β = q p / 2 Δ M ,

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