Abstract

The relationship between the defect signal which causes read error and the defect factor involved in the optical disk was extensively analyzed. This analysis dealt with the effect of an opaque foreign substance contained in the disk substrate covering the reflective layer, particularly by using wave optics where the defect signal was two-dimensionally represented. Using this generalized concept for the defect signal analysis, the relationships between the foreign substance and defect signal and defect rate were clarified.

© 1988 Optical Society of America

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