Abstract

Illuminated semiconductor panels scanned with a shadowed spot are used in transmission-mode millimeter wave image converters. To know the performance of this system one must know the response of the illuminated semiconductor panels scanned with the shadowed spot. In this paper the transmission coefficient of the illuminated semiconductor panels scanned with a shadowed strip is studied as a function of the scanning velocity, width of the strip, time, and position of the strip.

© 1987 Optical Society of America

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