Abstract

An absorbing substrate of complex refractive index n2 − jk2 at wavelength λ can be coated by an absorbing thin film of complex refractive index n1 − jk1 and thickness d to achieve zero reflection at normal incidence. For given n2,k2 multiple solutions (n1,k1,d/λ) are found that correspond to infinitely many distinct antireflection layers. This is demonstrated for a Si substrate at two wavelengths (6328 and 4420 Å). The response of these absorbing antireflection layers to changes of the angle of incidence from 0 to 45° and to changes of thickness of ±10% is also determined and compared to the limting case of a noabsorbing antireflection layer.

© 1987 Optical Society of America

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