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References

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  1. S. Bowyer, “The Extreme Ultraviolet Explorer and the Local Interstellar Medium,” Proc. COSPAR (1986).
  2. J. B. Pranke, A. B. Christensen, F. A. Morse, D. R. Hickman, W. T. Chater, C. K. Howey, D. A. Jones, “Satellite-borne Limb Scanning UV Spectrometer for Thermospheric Remote Sensing,” Appl. Opt. 21, 3941 (1982).
    [CrossRef] [PubMed]
  3. R. F. Malina, P. Jelinsky, S. Bowyer, “Calibration Techniques and Results in the Soft X-Ray and Extreme Ultraviolet for Components of the Extreme Ultraviolet Explorer Satellite,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, Paper 11 (1985).
  4. F. Paresce, S. Kumar, C. S. Bowyer, “A Continuous Discharge Line Source for the Extreme Ultraviolet,” Appl. Opt. 10, 1904 (1971).
    [CrossRef] [PubMed]
  5. Manufactured by Commercial Chemicals Division/3M, St. Paul, MN.
  6. Manufactured by Hughson Chemicals, Lord Corp., Erie, PA.
  7. O. H. W. Siegmund, R. F. Malina, “Detection of Extreme UV and Soft X-Rays with Microchannel Plates: A Review,” in Multichannel Image Detectors, Symposium Series 236, Vol. 2, Y. Talmi, Ed. (American Chemical Society, Washington, DC, 1983).
    [CrossRef]

1986 (1)

S. Bowyer, “The Extreme Ultraviolet Explorer and the Local Interstellar Medium,” Proc. COSPAR (1986).

1985 (1)

R. F. Malina, P. Jelinsky, S. Bowyer, “Calibration Techniques and Results in the Soft X-Ray and Extreme Ultraviolet for Components of the Extreme Ultraviolet Explorer Satellite,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, Paper 11 (1985).

1982 (1)

1971 (1)

Bowyer, C. S.

Bowyer, S.

S. Bowyer, “The Extreme Ultraviolet Explorer and the Local Interstellar Medium,” Proc. COSPAR (1986).

R. F. Malina, P. Jelinsky, S. Bowyer, “Calibration Techniques and Results in the Soft X-Ray and Extreme Ultraviolet for Components of the Extreme Ultraviolet Explorer Satellite,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, Paper 11 (1985).

Chater, W. T.

Christensen, A. B.

Hickman, D. R.

Howey, C. K.

Jelinsky, P.

R. F. Malina, P. Jelinsky, S. Bowyer, “Calibration Techniques and Results in the Soft X-Ray and Extreme Ultraviolet for Components of the Extreme Ultraviolet Explorer Satellite,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, Paper 11 (1985).

Jones, D. A.

Kumar, S.

Malina, R. F.

R. F. Malina, P. Jelinsky, S. Bowyer, “Calibration Techniques and Results in the Soft X-Ray and Extreme Ultraviolet for Components of the Extreme Ultraviolet Explorer Satellite,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, Paper 11 (1985).

O. H. W. Siegmund, R. F. Malina, “Detection of Extreme UV and Soft X-Rays with Microchannel Plates: A Review,” in Multichannel Image Detectors, Symposium Series 236, Vol. 2, Y. Talmi, Ed. (American Chemical Society, Washington, DC, 1983).
[CrossRef]

Morse, F. A.

Paresce, F.

Pranke, J. B.

Siegmund, O. H. W.

O. H. W. Siegmund, R. F. Malina, “Detection of Extreme UV and Soft X-Rays with Microchannel Plates: A Review,” in Multichannel Image Detectors, Symposium Series 236, Vol. 2, Y. Talmi, Ed. (American Chemical Society, Washington, DC, 1983).
[CrossRef]

Appl. Opt. (2)

Proc. COSPAR (1)

S. Bowyer, “The Extreme Ultraviolet Explorer and the Local Interstellar Medium,” Proc. COSPAR (1986).

Proc. Soc. Photo-Opt. Instrum. Eng. (1)

R. F. Malina, P. Jelinsky, S. Bowyer, “Calibration Techniques and Results in the Soft X-Ray and Extreme Ultraviolet for Components of the Extreme Ultraviolet Explorer Satellite,” Proc. Soc. Photo-Opt. Instrum. Eng. 597, Paper 11 (1985).

Other (3)

Manufactured by Commercial Chemicals Division/3M, St. Paul, MN.

Manufactured by Hughson Chemicals, Lord Corp., Erie, PA.

O. H. W. Siegmund, R. F. Malina, “Detection of Extreme UV and Soft X-Rays with Microchannel Plates: A Review,” in Multichannel Image Detectors, Symposium Series 236, Vol. 2, Y. Talmi, Ed. (American Chemical Society, Washington, DC, 1983).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Total scattering within ±3° to the plane of reflectance at 304 Å of the seven materials for various graze angles. The relatively large errors (±25%) are a result of the numerical integration over the finite number of scattering angle data taken: ———, alodined Al; ………………, bead blasted Al;— – — – —, Chemglaze Z-306; · — · — · —, bead blasted 304 stainless; – – – – – – –, Kel-F; · – · – · – · –·, Ni plated etched Mo;— — —, etched Mo.

Fig. 2
Fig. 2

Total scattering within ±3° to the plane of reflectance at 584 Å of the seven materials for various graze angles. The relatively large errors (±25%) are a result of the numerical integration over the finite number of scattering angle data taken: ———, alodined Al; ………………, bead blasted Al; — – — – —, Chemglaze Z-306; · — · — · —, bead blasted 304 stainless; – – – – – – –, Kel-F; · – · – · – · – ·, Ni plated etched Mo; — — —, etched Mo.

Fig. 3
Fig. 3

Total scattering within ±3° to the plane of reflectance at 1216 Å of the seven materials for various graze angles. The relatively large errors (±25%) are a result of the numerical integration over the finite number of scattering angle data taken: ———, alodined Al; ………………, bead blasted Al; — – —– – —, Chemglaze Z-306; · — · — · —, bead blasted 304 stainless; – – – – – – –, Kel-F; · – · – · – · – ·, Ni plated etched Mo; — — —, etched Mo.

Fig. 4
Fig. 4

Total integrated reflectance within ±3° to the plane of reflectance of the seven materials if illuminated by an isotopic diffuse beam for the three wavelengths: 304, 584, and 1216 Å. The relatively large errors (±35%) are a result of the numerical integration over the finite amount of graze angles: ———, alodined Al; ………………, bead blasted Al; — – — – —, Chemglaze Z306; · — · — · —, bead blasted 304 stainless; – – – – – – –, Kel-F; · – · – · – · – ·, Ni plated etched Mo; — — —, etched Mo.

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