Abstract

A sphere arrangement for directional-hemispherical reflectance measurements in the 1–15-μm wavelength range is tested for its accuracy. Comparative measurements with the fundamental PTB sphere reflectometer in the overlapping spectral range between 1.0 and 1.1 μm indicate no systematic measurement uncertainties of the new device. The uncertainty of the reflectance measured by it is therefrom deduced to be ±0.01 for the 1–5.6-μm wavelength range.

© 1987 Optical Society of America

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