Abstract

A microcomputer controlled apparatus utilizing a series of interference filters for wavelength selection has been developed for measuring the spectral response of large area solar cells irradiated by a high-intensity bias light. Sample results are given for several types of solar cell. These measurements are compared to the spectral responses obtained using monochromator-based apparatus providing low-level inhomogeneous irradiation on the cells. From this comparison, the advantages and disadvantages of the two methods are clearly seen.

© 1986 Optical Society of America

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References

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  1. K. L. Chopra, S. R. Das, Thin Film Solar Cells (Plenum, New York, 1983).
  2. J. S. Hartman, M. A. Lind, D. A. Chaudiere, “The Sensitivity of Calculated Short-Circuit Currents to Selected Irradiance Distributions and Solar Cell Spectral Responses,” Sol. Cells 6, 133 (1982).
    [CrossRef]
  3. J. S. Hartman, M. A. Lind, “Spectral Response Measurements for Solar Cells,” Sol. Cells 7, 147 (1982).
    [CrossRef]
  4. J. S. Hartman, M. A. Lind, “A Survey of Spectral Response Measurements for Photovoltaic Devices,” Report prepared for the Solar Energy Research Institute under contract DZ-0-9235 and the U.S. Department of Energy under contract DE-AC06-76RLO 1830 (1981).
  5. K. Krebs, “Standard Procedures for Terrestrial Photovoltaic Performance Measurements,” Specification 101, Issue 2, Commission of the European Communities (1981).
  6. B. C. Chambers, C. E. Backus, “Measurement of the Spectral Response of Silicon Solar Cells under Highly Illuminated Conditions,” in Proceedings, Third E.C. Photovoltaic Solar Energy Conference, Cannes (1980), p. 418.

1982 (2)

J. S. Hartman, M. A. Lind, D. A. Chaudiere, “The Sensitivity of Calculated Short-Circuit Currents to Selected Irradiance Distributions and Solar Cell Spectral Responses,” Sol. Cells 6, 133 (1982).
[CrossRef]

J. S. Hartman, M. A. Lind, “Spectral Response Measurements for Solar Cells,” Sol. Cells 7, 147 (1982).
[CrossRef]

1981 (1)

K. Krebs, “Standard Procedures for Terrestrial Photovoltaic Performance Measurements,” Specification 101, Issue 2, Commission of the European Communities (1981).

Backus, C. E.

B. C. Chambers, C. E. Backus, “Measurement of the Spectral Response of Silicon Solar Cells under Highly Illuminated Conditions,” in Proceedings, Third E.C. Photovoltaic Solar Energy Conference, Cannes (1980), p. 418.

Chambers, B. C.

B. C. Chambers, C. E. Backus, “Measurement of the Spectral Response of Silicon Solar Cells under Highly Illuminated Conditions,” in Proceedings, Third E.C. Photovoltaic Solar Energy Conference, Cannes (1980), p. 418.

Chaudiere, D. A.

J. S. Hartman, M. A. Lind, D. A. Chaudiere, “The Sensitivity of Calculated Short-Circuit Currents to Selected Irradiance Distributions and Solar Cell Spectral Responses,” Sol. Cells 6, 133 (1982).
[CrossRef]

Chopra, K. L.

K. L. Chopra, S. R. Das, Thin Film Solar Cells (Plenum, New York, 1983).

Das, S. R.

K. L. Chopra, S. R. Das, Thin Film Solar Cells (Plenum, New York, 1983).

Hartman, J. S.

J. S. Hartman, M. A. Lind, “Spectral Response Measurements for Solar Cells,” Sol. Cells 7, 147 (1982).
[CrossRef]

J. S. Hartman, M. A. Lind, D. A. Chaudiere, “The Sensitivity of Calculated Short-Circuit Currents to Selected Irradiance Distributions and Solar Cell Spectral Responses,” Sol. Cells 6, 133 (1982).
[CrossRef]

J. S. Hartman, M. A. Lind, “A Survey of Spectral Response Measurements for Photovoltaic Devices,” Report prepared for the Solar Energy Research Institute under contract DZ-0-9235 and the U.S. Department of Energy under contract DE-AC06-76RLO 1830 (1981).

Krebs, K.

K. Krebs, “Standard Procedures for Terrestrial Photovoltaic Performance Measurements,” Specification 101, Issue 2, Commission of the European Communities (1981).

Lind, M. A.

J. S. Hartman, M. A. Lind, D. A. Chaudiere, “The Sensitivity of Calculated Short-Circuit Currents to Selected Irradiance Distributions and Solar Cell Spectral Responses,” Sol. Cells 6, 133 (1982).
[CrossRef]

J. S. Hartman, M. A. Lind, “Spectral Response Measurements for Solar Cells,” Sol. Cells 7, 147 (1982).
[CrossRef]

J. S. Hartman, M. A. Lind, “A Survey of Spectral Response Measurements for Photovoltaic Devices,” Report prepared for the Solar Energy Research Institute under contract DZ-0-9235 and the U.S. Department of Energy under contract DE-AC06-76RLO 1830 (1981).

Sol. Cells (2)

J. S. Hartman, M. A. Lind, D. A. Chaudiere, “The Sensitivity of Calculated Short-Circuit Currents to Selected Irradiance Distributions and Solar Cell Spectral Responses,” Sol. Cells 6, 133 (1982).
[CrossRef]

J. S. Hartman, M. A. Lind, “Spectral Response Measurements for Solar Cells,” Sol. Cells 7, 147 (1982).
[CrossRef]

Specification 101, Issue 2, Commission of the European Communities (1)

K. Krebs, “Standard Procedures for Terrestrial Photovoltaic Performance Measurements,” Specification 101, Issue 2, Commission of the European Communities (1981).

Other (3)

B. C. Chambers, C. E. Backus, “Measurement of the Spectral Response of Silicon Solar Cells under Highly Illuminated Conditions,” in Proceedings, Third E.C. Photovoltaic Solar Energy Conference, Cannes (1980), p. 418.

J. S. Hartman, M. A. Lind, “A Survey of Spectral Response Measurements for Photovoltaic Devices,” Report prepared for the Solar Energy Research Institute under contract DZ-0-9235 and the U.S. Department of Energy under contract DE-AC06-76RLO 1830 (1981).

K. L. Chopra, S. R. Das, Thin Film Solar Cells (Plenum, New York, 1983).

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Figures (9)

Fig. 1
Fig. 1

Schematic diagram of apparatus for measurement of the spectral response of solar cells using interference filters for wavelength selection and a solar simulator for bias light.

Fig. 2
Fig. 2

Schematic diagram of monochromator-based apparatus for low-intensity level spectral response measurements of solar cells.

Fig. 3
Fig. 3

Effect of an error in the measured center wavelength of the filters: the solid curve has an error of −5 nm for one filter (1042 nm) relative to true data (dashed curve).

Fig. 4
Fig. 4

Reproducibility from day to day of the spectral response measurements with the filter method (Fig. 1): NRC7 solar cell, measured with no bias light, four curves superimposed.

Fig. 5
Fig. 5

Spectral response of monocrystalline silicon solar cell NRC9, measured with bias light (solid line) and without bias light (dashed line).

Fig. 6
Fig. 6

Spectral response of polycrystalline silicon solar cell NRC18, measured with bias light (solid line) and without bias light (dashed line).

Fig. 7
Fig. 7

Spectral response of thin film amorphous silicon solar cell NRC1, measured with bias light (solid line) and without bias light (dashed line).

Fig. 8
Fig. 8

Comparison of spectral response measurements by the filter method (no bias light, solid line) and by the monochromator method (dashed line): monocrystalline silicon solar cell NRC9.

Fig. 9
Fig. 9

Comparison of spectral response measurements by the filter method (no bias light, solid line) and by the monochromator method (dashed lines): thin film amorphous silicon solar cell NRC1. The two dashed curves correspond to two different areas of the cell being irradiated by the test beam in the monochromator method.

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