Abstract

We recall the analytical expression that gives, for a rough surface illuminated at normal incidence, the light scattered in the half-space containing the specular reflection direction. Two cases are studied: the bare substrate and the substrate coated with one transparent layer. It is shown, for this specular direction, that the light scattered from a single layer can be equal to zero (perfect antiscattering) in certain conditions relative to the roughnesses of the two layer interfaces. Data calculation proves that this antiscattering effect occurs in all directions of the half-space of the reflected light. The experimental results are in good agreement with this theoretical analysis for five different dielectric materials. This study brings out most information about the grain of the material, which is responsible for the residual roughness.

© 1986 Optical Society of America

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Figures (11)

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