Abstract

Thin films of lead fluoride were deposited by means of cw or pulsed laser assisted evaporation and were characterized for their structural and optical properties. Continuous wave laser evaporated films had smooth morphology, good optical transmission, and oriented columnar grain structure. The crystallinity of the pulse laser evaporated films, as measured by x-ray diffraction peak intensities, was found to be higher than the cw laser or e-beam evaporated films and was found to depend on the laser pulse energy density (fluence). These films, however, had higher absorption in the visible range.

© 1986 Optical Society of America

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