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References

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  1. H. E. Bennett, “Scattering Characteristics of Optical Materials,” Opt. Eng. 17, 480 (1978).
    [Crossref]
  2. J. A. Detrio, “Light Scattering Surface Roughness Characterization,” Proc. Soc. Photo-Opt. Instrum. Eng. 276, 136 (1981).
  3. J. M. Herbelin et al., “Sensitive Measurement of Photon Lifetime and True Reflectances in an Optical Cavity by a Phase-Shift Method,” Appl. Opt. 19, 144 (1980).
    [Crossref] [PubMed]
  4. W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

1982 (1)

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

1981 (1)

J. A. Detrio, “Light Scattering Surface Roughness Characterization,” Proc. Soc. Photo-Opt. Instrum. Eng. 276, 136 (1981).

1980 (1)

1978 (1)

H. E. Bennett, “Scattering Characteristics of Optical Materials,” Opt. Eng. 17, 480 (1978).
[Crossref]

Bennett, H. E.

H. E. Bennett, “Scattering Characteristics of Optical Materials,” Opt. Eng. 17, 480 (1978).
[Crossref]

Detrio, J. A.

J. A. Detrio, “Light Scattering Surface Roughness Characterization,” Proc. Soc. Photo-Opt. Instrum. Eng. 276, 136 (1981).

Hays, D. D.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Herbelin, J. M.

Mann, I. B.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Martin, P. M.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Pawlewicz, W. T.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Appl. Opt. (1)

Opt. Eng. (1)

H. E. Bennett, “Scattering Characteristics of Optical Materials,” Opt. Eng. 17, 480 (1978).
[Crossref]

Proc. Soc. Photo-Opt. Instrum. Eng. (2)

J. A. Detrio, “Light Scattering Surface Roughness Characterization,” Proc. Soc. Photo-Opt. Instrum. Eng. 276, 136 (1981).

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

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Figures (1)

Fig. 1
Fig. 1

TIS measurements on bare and aluminized mirrors.

Equations (3)

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TIS = ρ rs V s / ρ s V rs = k V s / ρ s ,
Ξ = TIS BDM / TIS ADM = ( ρ ADM / ρ BDM ) ( V BDM / V ADM ) ,
Ξ = 0.91 V BDM / V ADM .

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