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References

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  1. O. Kafri, “Noncoherent Method for Phase Object Mapping,” Opt. Lett. 5, 555 (1980).
    [CrossRef] [PubMed]
  2. O. Kafri, A. Livnat, “Reflective Surface Analysis Using Moire Deflectometry,” Appl. Opt. 20, 3098 (1981).
    [CrossRef] [PubMed]
  3. O. Kafri, E. Keren, A. Livnat, “Infinite Fringe Moire Deflectometry,” Appl. Opt. 21, 3884 (1982).
    [CrossRef] [PubMed]
  4. O. Kafri, “Moire Deflectometry,” Phys. Bull. 33, 197 (1982).
  5. E. Keren, O. Kafri, “Diffraction Effects in Moire Deflectometry,” J. Opt. Soc. Am. A 2, 111 (1985).
    [CrossRef]
  6. J. Krasinski, D. F. Heller, O. Kafri, “Phase Object Microscopy,” submitted.

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1980

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Figures (2)

Fig. 1
Fig. 1

Schematic description of the setup. When a beam is deflected by an amount φ at the entrance of a telescope, its deflection at the exit plane is increased by the magnification M of the telescope. The enhanced ray deflection is monitored by the two gratings G1 and G2.

Fig. 2
Fig. 2

(a) Deflectogram of a candle’s flame with an angular resolution of 3 × 10−4 rad; (b) the same object and deflectometer setup with a 7× telescope.

Equations (3)

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δ φ δ x = λ / 2 π ,
L = p 2 / λ .
M δ φ ( δ x / M ) > λ / 2 π .

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