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  1. G. Brändli, A. J. Sievers, “Absolute Measurement of the Far-Infrared Surface Resistance of Pb,” Phys Rev. B 5, 3550 (1972).
    [CrossRef]
  2. M. von Ortenberg, “Application of the Strip Transmission Line in Submillimetre Spectroscopy,” Infrared Phys. 18, 735 (1978).
    [CrossRef]
  3. “Teflon FEP Fluorocarbon Film: Optical Properties,” Dupont Technical Bulletin T-5A, E.I. Du Pont De Nemours & Co. (Inc.), Plastics Products and Resins Department, Fluorocarbons Division, Wilmington, Del. 19898.
  4. M. S. Caceci, W. P. Cacheris, “Fitting Curves to Data: The Simplex Algorithm is the Answer,” Byte 9, 340 (1984).
  5. G. W. Chantry, in Infrared and Millimeter Waves, Vol. 8, K. J. Button, Ed. (Academic, New York, 1983), Chap. 1, p. 44.

1984

M. S. Caceci, W. P. Cacheris, “Fitting Curves to Data: The Simplex Algorithm is the Answer,” Byte 9, 340 (1984).

1978

M. von Ortenberg, “Application of the Strip Transmission Line in Submillimetre Spectroscopy,” Infrared Phys. 18, 735 (1978).
[CrossRef]

1972

G. Brändli, A. J. Sievers, “Absolute Measurement of the Far-Infrared Surface Resistance of Pb,” Phys Rev. B 5, 3550 (1972).
[CrossRef]

Brändli, G.

G. Brändli, A. J. Sievers, “Absolute Measurement of the Far-Infrared Surface Resistance of Pb,” Phys Rev. B 5, 3550 (1972).
[CrossRef]

Caceci, M. S.

M. S. Caceci, W. P. Cacheris, “Fitting Curves to Data: The Simplex Algorithm is the Answer,” Byte 9, 340 (1984).

Cacheris, W. P.

M. S. Caceci, W. P. Cacheris, “Fitting Curves to Data: The Simplex Algorithm is the Answer,” Byte 9, 340 (1984).

Chantry, G. W.

G. W. Chantry, in Infrared and Millimeter Waves, Vol. 8, K. J. Button, Ed. (Academic, New York, 1983), Chap. 1, p. 44.

Sievers, A. J.

G. Brändli, A. J. Sievers, “Absolute Measurement of the Far-Infrared Surface Resistance of Pb,” Phys Rev. B 5, 3550 (1972).
[CrossRef]

von Ortenberg, M.

M. von Ortenberg, “Application of the Strip Transmission Line in Submillimetre Spectroscopy,” Infrared Phys. 18, 735 (1978).
[CrossRef]

Byte

M. S. Caceci, W. P. Cacheris, “Fitting Curves to Data: The Simplex Algorithm is the Answer,” Byte 9, 340 (1984).

Infrared Phys.

M. von Ortenberg, “Application of the Strip Transmission Line in Submillimetre Spectroscopy,” Infrared Phys. 18, 735 (1978).
[CrossRef]

Phys Rev. B

G. Brändli, A. J. Sievers, “Absolute Measurement of the Far-Infrared Surface Resistance of Pb,” Phys Rev. B 5, 3550 (1972).
[CrossRef]

Other

“Teflon FEP Fluorocarbon Film: Optical Properties,” Dupont Technical Bulletin T-5A, E.I. Du Pont De Nemours & Co. (Inc.), Plastics Products and Resins Department, Fluorocarbons Division, Wilmington, Del. 19898.

G. W. Chantry, in Infrared and Millimeter Waves, Vol. 8, K. J. Button, Ed. (Academic, New York, 1983), Chap. 1, p. 44.

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Figures (1)

Fig. 1
Fig. 1

α(ω) for Teflon. The solid circles with error bars are the data of Table I for Teflon FEP. The solid line is the data of Chantry5 for Teflon TFE.

Tables (1)

Tables Icon

Table I Measured Values of the Absorption Coefficient of Teflon FEP Film

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