Abstract

No abstract available.

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. O. Kafri, “Noncoherent Method for Mapping Phase Objects,” Opt. Lett. 5, 555 (1980).
    [CrossRef] [PubMed]
  2. E. Keren, E. Bar-Ziv, I. Glatt, O. Kafri, “Measurements of Temperature Distribution of Flames by Moire Deflectometry,” Appl. Opt. 20, 4263 (1981).
    [CrossRef] [PubMed]
  3. J. Stricker, “Analysis of 3-D Phase Objects by Moire Deflectometry,” Appl. Opt. 23, 3657 (1984).
    [CrossRef] [PubMed]
  4. J. Stricker, “Electronic Heterodyne Readout of Fringes in Moire Deflectometry,” Opt. Lett. 10, 247 (1985).
    [CrossRef] [PubMed]
  5. D. B. Rhodes, J. M. Franke, S. B. Jones, B. D. Leighty, “Moire Deflectometry with Deferred Analysis,” Appl. Opt. 22, 652 (1983).
    [CrossRef] [PubMed]
  6. J. Strieker, J. Politch “Holographic Moire Deflectometry—a Method for Stiff Density Fields Analysis,” Appl. Phys. Lett. 44, 723 (1984).
    [CrossRef]

1985 (1)

1984 (2)

J. Stricker, “Analysis of 3-D Phase Objects by Moire Deflectometry,” Appl. Opt. 23, 3657 (1984).
[CrossRef] [PubMed]

J. Strieker, J. Politch “Holographic Moire Deflectometry—a Method for Stiff Density Fields Analysis,” Appl. Phys. Lett. 44, 723 (1984).
[CrossRef]

1983 (1)

1981 (1)

1980 (1)

Bar-Ziv, E.

Franke, J. M.

Glatt, I.

Jones, S. B.

Kafri, O.

Keren, E.

Leighty, B. D.

Politch, J.

J. Strieker, J. Politch “Holographic Moire Deflectometry—a Method for Stiff Density Fields Analysis,” Appl. Phys. Lett. 44, 723 (1984).
[CrossRef]

Rhodes, D. B.

Stricker, J.

Strieker, J.

J. Strieker, J. Politch “Holographic Moire Deflectometry—a Method for Stiff Density Fields Analysis,” Appl. Phys. Lett. 44, 723 (1984).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (3)

Fig. 1
Fig. 1

Schematic of the experiemental setup for postanalyzing phase objects: G, Ronchi ruling; R.S. and T.S., reference and test signals, respectively; G.S., gating signal.

Fig. 2
Fig. 2

Stationary moire fringe pattern of an 11.56-m focal length lens. rR is the fixed location of the reference detector, and r1, and r2 are the locations of the test detector.

Fig. 3
Fig. 3

Relative phase of the signals produced by the reference detector (curves A) and test detector (curves B) for three different positions of the test detector along the axis perpendicular to the fringes. The relative phases are (a) Ψ = 0°, (b) Ψ = 90°, (c) Ψ = 180°.

Metrics