Abstract

The technique of total internal reflection microscopy (TIRM) introduced by P. Temple for inspection of the surface structure of transparent substrates is extended here for use with materials exhibiting high bulk scatter. A strong dependence of scratch illumination on the angle between scratches and the S polarization direction is observed and explained via a simple model.

© 1985 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Total internal reflection microscopy: a surface inspection technique

P. A. Temple
Appl. Opt. 20(15) 2656-2664 (1981)

Novel perspectives for the application of total internal reflection microscopy

Giovanni Volpe, Thomas Brettschneider, Laurent Helden, and Clemens Bechinger
Opt. Express 17(26) 23975-23985 (2009)

Highly confined surface imaging by solid immersion total internal reflection fluorescence microscopy

Lin Wang, Cvetelin Vasilev, Daniel P. Canniffe, Luke R. Wilson, C. Neil Hunter, and Ashley J. Cadby
Opt. Express 20(3) 3311-3324 (2012)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (7)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (8)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription