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  1. F. Low, “Application of JFETs to Low Background Focal Planes in Space,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 56 (1981).
  2. F. Goulding, “Some Aspects of Detectors and Electronics for X-Ray Fluorescence Analysis,” Nucl. Instrum. Methods 142, 213 (1977).
    [CrossRef]
  3. E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

1981 (2)

F. Low, “Application of JFETs to Low Background Focal Planes in Space,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 56 (1981).

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

1977 (1)

F. Goulding, “Some Aspects of Detectors and Electronics for X-Ray Fluorescence Analysis,” Nucl. Instrum. Methods 142, 213 (1977).
[CrossRef]

Fazio, G.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Gautier, T.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Goulding, F.

F. Goulding, “Some Aspects of Detectors and Electronics for X-Ray Fluorescence Analysis,” Nucl. Instrum. Methods 142, 213 (1977).
[CrossRef]

Hoffmann, W.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Katz, L.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Koch, D.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Low, F.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

F. Low, “Application of JFETs to Low Background Focal Planes in Space,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 56 (1981).

Poteet, W.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Rieke, G.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Traub, W.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Urban, E.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Young, E.

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

Nucl. Instrum. Methods (1)

F. Goulding, “Some Aspects of Detectors and Electronics for X-Ray Fluorescence Analysis,” Nucl. Instrum. Methods 142, 213 (1977).
[CrossRef]

Proc. Soc. Photo-Opt. Instrum. Eng. (2)

E. Young, G. Rieke, T. Gautier, W. Hoffmann, F. Low, W. Poteet, G. Fazio, D. Koch, W. Traub, E. Urban, L. Katz, “Test Results of Spacelab 2 Infrared Telescope Focal Plane,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 12 (1981).

F. Low, “Application of JFETs to Low Background Focal Planes in Space,” Proc. Soc. Photo-Opt. Instrum. Eng. 280, 56 (1981).

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Figures (2)

Fig. 1
Fig. 1

Basic integrating JFET circuit with a p channel enhancement mode MOSFET reset switch and a Si:Sb photoconductor. The indicated waveform shows the reset followed by the linear ramp corresponding to both strong and weak signal conditions. The 2N6483 must be between 50 and 80 K; the MOSFET may be cooled to 4 K.

Fig. 2
Fig. 2

Strip chart records of a test with an Si:Sb detector in three conditions: (a) cold shutter closed, no IR photons present; (b) shutter open, BB source at 773 K; (c) shutter open, BB source at 295 K. Bias voltage = 4.0 V; bandwidth 0–4 Hz; I = (1 × 10−11) dv/dt.

Tables (2)

Tables Icon

Table I Test Results with 2.5 × 2.5-mm Si:Sb Detector at 4.2 K

Tables Icon

Table II Performance of J230 vs 2N6483 at 77 K

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