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References

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  1. R. Turner, E. K. Pfitzer, Metrologia 6, 94 (1970).
    [CrossRef]
  2. G. L. Bourdet, A. G. Orszag, Appl. Opt. 18, 225 (1979).
    [CrossRef] [PubMed]
  3. C. W. Gillard, N. E. Buholz, D. W. Ridder, Opt. Eng. 20, 129 (1981).
    [CrossRef]
  4. H. Matsumoto, S. Seino, Ann. CIRP 31, 401 (1982).
    [CrossRef]
  5. C. O. Weiss, J. Heppner, J. Phys. E 12, 67 (1979).
    [CrossRef]
  6. H. Matsumoto, Appl. Phys. 24, 65 (1981).
    [CrossRef]

1982 (1)

H. Matsumoto, S. Seino, Ann. CIRP 31, 401 (1982).
[CrossRef]

1981 (2)

C. W. Gillard, N. E. Buholz, D. W. Ridder, Opt. Eng. 20, 129 (1981).
[CrossRef]

H. Matsumoto, Appl. Phys. 24, 65 (1981).
[CrossRef]

1979 (2)

1970 (1)

R. Turner, E. K. Pfitzer, Metrologia 6, 94 (1970).
[CrossRef]

Bourdet, G. L.

Buholz, N. E.

C. W. Gillard, N. E. Buholz, D. W. Ridder, Opt. Eng. 20, 129 (1981).
[CrossRef]

Gillard, C. W.

C. W. Gillard, N. E. Buholz, D. W. Ridder, Opt. Eng. 20, 129 (1981).
[CrossRef]

Heppner, J.

C. O. Weiss, J. Heppner, J. Phys. E 12, 67 (1979).
[CrossRef]

Matsumoto, H.

H. Matsumoto, S. Seino, Ann. CIRP 31, 401 (1982).
[CrossRef]

H. Matsumoto, Appl. Phys. 24, 65 (1981).
[CrossRef]

Orszag, A. G.

Pfitzer, E. K.

R. Turner, E. K. Pfitzer, Metrologia 6, 94 (1970).
[CrossRef]

Ridder, D. W.

C. W. Gillard, N. E. Buholz, D. W. Ridder, Opt. Eng. 20, 129 (1981).
[CrossRef]

Seino, S.

H. Matsumoto, S. Seino, Ann. CIRP 31, 401 (1982).
[CrossRef]

Turner, R.

R. Turner, E. K. Pfitzer, Metrologia 6, 94 (1970).
[CrossRef]

Weiss, C. O.

C. O. Weiss, J. Heppner, J. Phys. E 12, 67 (1979).
[CrossRef]

Ann. CIRP (1)

H. Matsumoto, S. Seino, Ann. CIRP 31, 401 (1982).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. (1)

H. Matsumoto, Appl. Phys. 24, 65 (1981).
[CrossRef]

J. Phys. E (1)

C. O. Weiss, J. Heppner, J. Phys. E 12, 67 (1979).
[CrossRef]

Metrologia (1)

R. Turner, E. K. Pfitzer, Metrologia 6, 94 (1970).
[CrossRef]

Opt. Eng. (1)

C. W. Gillard, N. E. Buholz, D. W. Ridder, Opt. Eng. 20, 129 (1981).
[CrossRef]

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Figures (2)

Fig. 1
Fig. 1

(a) Output power as a function of cavity length; (b) two-wavelength operation technique.

Fig. 2
Fig. 2

Generated 298-μm synthetic wavelength signal.

Tables (1)

Tables Icon

Table I Obtained Synthetic Wavelengths

Metrics