Abstract

In a systematic and straightforward way general conditions are derived for establishing broadband antireflective coatings for the near infrared (700–1700 nm). Such coatings can be suitably applied to optical components of fiber-optical communication systems. The evaluated procedure indicates how, where, and by what means the broadest and lowest reflectance conditions are to be found.

© 1984 Optical Society of America

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References

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  1. H. A. MacLeod, Thin-Film Optical Filters (Adam Hilger, Ltd., London, 1969).
  2. Z. Knittl, Optics of Thin Films (Wiley, London, 1976).
  3. G. Hass, R. E. Thun, Physics of Thin Films Vol. 2 (Academic, New York, 1964).
  4. A. Musset, A. Thelen, Prog. Opt. 8, 201 (1970).
    [CrossRef]
  5. United Kingdom, Patent specification1, 380, 793.

1970

A. Musset, A. Thelen, Prog. Opt. 8, 201 (1970).
[CrossRef]

Hass, G.

G. Hass, R. E. Thun, Physics of Thin Films Vol. 2 (Academic, New York, 1964).

Knittl, Z.

Z. Knittl, Optics of Thin Films (Wiley, London, 1976).

MacLeod, H. A.

H. A. MacLeod, Thin-Film Optical Filters (Adam Hilger, Ltd., London, 1969).

Musset, A.

A. Musset, A. Thelen, Prog. Opt. 8, 201 (1970).
[CrossRef]

Thelen, A.

A. Musset, A. Thelen, Prog. Opt. 8, 201 (1970).
[CrossRef]

Thun, R. E.

G. Hass, R. E. Thun, Physics of Thin Films Vol. 2 (Academic, New York, 1964).

Prog. Opt.

A. Musset, A. Thelen, Prog. Opt. 8, 201 (1970).
[CrossRef]

Other

United Kingdom, Patent specification1, 380, 793.

H. A. MacLeod, Thin-Film Optical Filters (Adam Hilger, Ltd., London, 1969).

Z. Knittl, Optics of Thin Films (Wiley, London, 1976).

G. Hass, R. E. Thun, Physics of Thin Films Vol. 2 (Academic, New York, 1964).

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Figures (14)

Fig. 1
Fig. 1

Compositional structure of a broadband five-layer stack.

Fig. 2
Fig. 2

Reflectance R as a function of wavelength for the stack of Fig. 1 in a step-by-step evaluation.

Fig. 3
Fig. 3

Compositional structure of a three-layer stack.

Fig. 4
Fig. 4

Reflectance R as a function of relative frequency for a three-layer stack.

Fig. 5
Fig. 5

Three-dimensional representation of the reflectance R as functions of frequency and n3 for a three-layer stack: n0 = 1; 1.03 < n2 < 3.25; 1.40 < n3 < 4.40; ns = 3.5; 0.04 < frel < 2.04; (a) Rtruncated = 12.5%; (b) Rtruncated = 2.5%; (c) Rtruncated = 05%.

Fig. 6
Fig. 6

Three-dimensional representation of the reflectance R ¯ as functions of wavelength and n3 for a three-layer stack: n0 = 1; 1.03 < n2 < 3.25; 1.40 < n3 < 4.40; ns = 3.5; 700 < λ(nm) < 1800; (a) Rtruncated = 12.5%; (b) Rtruncated = 2.5%; (c) Rtruncated = 0.5%.

Fig. 7
Fig. 7

n1 × n3,m as a function of n 2 , m × n s and n1 × n3,m as a function of (n2,m)2; zero-minimum value in R; 1.5 < ns < 3.5.

Fig. 8
Fig. 8

n1 × n3,f as a function of n 2 , m × n s and n1 × n3,f as a function of (n2,m)2; broadest and flattest situation of R; 1.5 < ns < 3.5.

Fig. 9
Fig. 9

Three-dimensional representation of the reflectance R as functions of wavelength and ns.

Fig. 10
Fig. 10

Three-dimensional representation of the reflectance R as functions of wavelength and n1.

Fig. 11
Fig. 11

n2,m; n3,f as a function of n1 for ns = 3.50.

Fig. 12
Fig. 12

n2,m; n3,f as a function of ns for optimum conditions of broadband antireflective coatings.

Fig. 13
Fig. 13

Δλ interval for the reflectance truncated at 0.5% as a function of n s / n 1; Δλ interval means the wavelength range over which R is smaller than 0.5%.

Fig. 14
Fig. 14

Reflectance as a function of wavelength for a five-layer stack on top of a relatively high-index glass substrate graded to a low-index value.

Tables (1)

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Table I Quantitative Data of a Three-Layer Coating on a High-index Substrate (ns = 3.50)

Equations (9)

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n 1 × n 3 = n 2 2 ,
n 2 2 = n 0 × n s ,
or n 2 = n 0 × n s .
n 1 × n 3 = n 2 × n 0 × n s .
n 1 × n 3 = n 2 × n 0 × n s ;
n 1 × n 3 , m = n 2 , m × n s ,
n 1 × n 3 , m = - a + b ( n 2 , m ) 2 ,
n 1 × n 3 , f = c ( n 2 , m × n s ) ,
n 1 × n 3 , f = d ( n 2 , m ) 2 ,

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