Abstract
A technique is described for routinely measuring reflectance of small area nontranslucent samples over the 410–700-nm wavelength range. The new sampling area has a 4.57 nm diam, which is 9.9 times smaller than the sampling area used for conventional measurements with the Cary 17D spectrophotometer. The accuracy and precision uncertainties of the measured reflectances are ±0.0066 and ±0.0032, respectively, with respect to the two master standards at the National Bureau of Standards. These values are not significantly different than the corresponding uncertainties obtained using the original sampling area: ±0.0059 and ±0.0029, respectively.
© 1984 Optical Society of America
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