Abstract

The concentration profile of various dopants (germanium, phosphorus, and fluorine) in preforms and optical fibers has been obtained with a Raman microprobe. A 2-μm spatial resolution was achieved. In the case of germanium and phosphorus, the results agree quite well with those obtained with an electron microprobe. Raman spectroscopy easily detects fluorine. From measurements of various F-doped samples, diffusion of fluorine in undoped and doped silica is suggested.

© 1984 Optical Society of America

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