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Optical recording in amorphous hydrogenated tellurium

L. M. Schiavone, M. A. Bosch, H. R. Haller, W. E. Hubbard, E. Good, and J. L. Shay

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Abstract

The optical writing characteristics of sputtered tellurium films are presented. We compare thin films sputtered in argon with those sputtered in an Ar-H2 mixture. Preliminary stress tests are described.

© 1984 Optical Society of America

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