Abstract

A method is proposed for measuring the wavefront aberration of a fast aspherical surface. The combination of the Ronchi test and the synchronous phase detection method provides a simple but powerful tool for aspherical surface evaluation. In a common setup for the Ronchi test, translating the Ronchi ruling sideways causes the irradiance of the Ronchigram to vary periodically with time. This enables us to make synchronous phase detection in the Ronchi test. The procedure for Ronchigram analysis is presented, and experimental results are shown.

© 1984 Optical Society of America

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References

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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
  8. T. Yatagai, T. Kanou, “Aspherical Surface Testing with Shearing Interferometer Using Fringe Scanning Detection Method,” Opt. Eng. 23, 357 (1984).
    [CrossRef]
  9. A. Cornejo, in Optical Shop Testing, D. Malacara, Ed. Wiley, New York, 1978), pp. 283–322.
  10. J. H. Bruning, D. R. Heriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, D. J. Brangaccio, “Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses,” Appl. Opt. 13, 2693 (1974).
    [CrossRef] [PubMed]

1984 (1)

T. Yatagai, T. Kanou, “Aspherical Surface Testing with Shearing Interferometer Using Fringe Scanning Detection Method,” Opt. Eng. 23, 357 (1984).
[CrossRef]

1978 (1)

1974 (2)

1973 (2)

1972 (1)

1971 (1)

Bennett, V. P.

Brangaccio, D. J.

Bruning, J. H.

Cornejo, A.

D. Malacara, A. Cornejo, “Null Ronchi Test for Aspherical Surfaces,” Appl. Opt. 13, 1778 (1974).
[CrossRef] [PubMed]

A. Cornejo, in Optical Shop Testing, D. Malacara, Ed. Wiley, New York, 1978), pp. 283–322.

Gallagher, J. E.

Heriott, D. R.

Jerke, J. M.

Kanou, T.

T. Yatagai, T. Kanou, “Aspherical Surface Testing with Shearing Interferometer Using Fringe Scanning Detection Method,” Opt. Eng. 23, 357 (1984).
[CrossRef]

MacGovern, A. J.

Malacara, D.

Murty, M. V. R. K.

M. V. R. K. Murty, in Optical Shop Testing, D. Malacara, Ed. (Wiley, New York, 1978), pp. 81–148.

Nyyssonen, D.

Rosenfeld, D. P.

Saito, H.

White, A. D.

Wyant, J. C.

Yatagai, T.

T. Yatagai, T. Kanou, “Aspherical Surface Testing with Shearing Interferometer Using Fringe Scanning Detection Method,” Opt. Eng. 23, 357 (1984).
[CrossRef]

T. Yatagai, H. Saito, “Interferometric Testing with Computer-Generated Holograms: Aberration Balancing Method and Error Analysis,” Appl. Opt. 17, 558 (1978).
[CrossRef] [PubMed]

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Figures (8)

Fig. 1
Fig. 1

Geometry of Ronchi Test.

Fig. 2
Fig. 2

Block diagram of a fringe scanning Ronchi test.

Fig. 3
Fig. 3

Ronchigrams with different phases.

Fig. 4
Fig. 4

Intensity profiles of a Ronchigram with different phases. A sectional line is measured parallel to the x direction.

Fig. 5
Fig. 5

Intensity variation for phase shift at a point on the Ronchigram.

Fig. 6
Fig. 6

Phase profile of the Ronchigram with 2π phase discontinuities.

Fig. 7
Fig. 7

Phase profile after phase discontinuity correction.

Fig. 8
Fig. 8

Wave front aberration given by integrating the phase profile of Fig. 6.

Equations (12)

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W ξ = - x R ,
W η = - y R ,
f ( x , δ ) = 1 + γ cos [ 2 π d ( x + δ ) ] ,
f ( ξ , δ ) = 1 + γ cos [ 2 π d ( R W ξ - δ ) ] .
2 π d R W ξ = 2 π m ,             ( m = 0 , ± 1 , ) .
W ξ = d R m .
δ n = d N n ,             ( n = 0 , 1 , , N - 1 ) ,
C 1 ( ξ ) = n = 0 N - 1 f ( ξ , δ n ) cos 2 π n N ,
S 1 ( ξ ) = n = 0 N - 1 f ( ξ , δ n ) sin 2 π n N ,
2 π d R W ξ = arctan S 1 C 1 .
W ξ = d 2 π R arctan S 1 C 1 .
W ( ξ ) = W ξ d ξ .

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