Abstract

It is shown that an image of absolute object phase may be produced by integrating a differential phase contrast image produced by a large area split detector. Even though integration is being carried out only along the scan lines, a full 2-D phase image is produced by surrounding the object with a medium of uniform path length and resetting the integrator at the beginning of each scan line. Images of a buccal epithelium cell demonstrate the technique.

© 1984 Optical Society of America

Full Article  |  PDF Article
More Like This
Images of phase edges in conventional and scanning optical microscopes

T. Wilson
Appl. Opt. 20(18) 3238-3244 (1981)

Effect of spherical aberration on the imaging properties of scanning optical microscopes

C. J. R. Sheppard and T. Wilson
Appl. Opt. 18(7) 1058-1063 (1979)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (8)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (32)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Metrics