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Corrections

Jerry Edelstein, Michael C. Hettrick, Stanley Mrowka, Patrick Jelinsky, and Christopher Martin, "Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum," Appl. Opt. 24, 153-153 (1985)
https://www.osapublishing.org/ao/abstract.cfm?uri=ao-24-2-153

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Equations (4)

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