Abstract

Far-infrared specular reflectance spectra of seven optically black coatings near normal incidence are presented. Seven photometric spectra were obtained using eleven bandpass transmission filters in the wavelength range between 12 and 500 μm, and three interferometric spectra were obtained for corroboration. Data on the construction, thickness, and rms surface roughness of the coatings are also presented. The chemical composition of three coatings can be distinguished from that of the others by a strong absorption feature between 20 and 40 μm, which can be largely attributed to amorphous silicate material. At 100 μm, the most and least reflective coatings differ by nearly 3 orders of magnitude. Inverse relationships observed between the spectra and the roughness and thickness of the coatings led to development of a reflecting-layer model for the measured reflectance. The model successfully describes the spectra at wavelengths outside the silicate absorption, and optical constants are deduced from a nonlinear least squares fit to the data. Parametric errors are estimated by chi-square analysis, and sensitivity tests are performed to determine which parameters control reflectance in different spectral regions.

© 1984 Optical Society of America

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