Abstract

Raman spectroscopy can be used to characterize the rutile/anatase phase composition of TiO2 layers in all-dielectric filters and reflectors of arbitrary design. No special specimen preparation is necessary. Interference effects can enhance Raman scattering compared to single-layer coatings of the same total TiO2 thickness.

© 1984 Optical Society of America

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References

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  1. W. T. Pawlewicz, G. J. Exarhos, W. E. Conaway, “Structural Characterization of TiO2 Optical Coatings by Raman Spectroscopy,” Appl. Opt. 22, 1837 (1983).
    [CrossRef] [PubMed]
  2. W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

1983 (1)

1982 (1)

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Conaway, W. E.

Exarhos, G. J.

Hays, D. D.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Mann, I. B.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Martin, P. M.

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Pawlewicz, W. T.

W. T. Pawlewicz, G. J. Exarhos, W. E. Conaway, “Structural Characterization of TiO2 Optical Coatings by Raman Spectroscopy,” Appl. Opt. 22, 1837 (1983).
[CrossRef] [PubMed]

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

Appl. Opt. (1)

Proc. Soc. Photo-Opt. Instrum. Eng. (1)

W. T. Pawlewicz, P. M. Martin, D. D. Hays, I. B. Mann, “Recent Developments in Reactively Sputtered Optical Thin Films,” Proc. Soc. Photo-Opt. Instrum. Eng. 325, 105 (1982).

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Figures (3)

Fig. 1
Fig. 1

Spectral transmission characteristics for four different coating designs examined: A, TiO2 single layer; B, single-cavity filter; C, three-cavity filter; and D, high reflector.

Fig. 2
Fig. 2

Measured Raman spectra using 514.5-nm excitation for (1) TiO2 single layer coating and (2) three-cavity filter.

Fig. 3
Fig. 3

Normalized Raman spectra for the high reflector as a function of excitation wavelength: (1) 501.7 nm; (2) 488.0 nm; (3) 457.9 nm; (4) 514.5 nm.

Tables (1)

Tables Icon

Table I Normalizeda Integrated Intensity (120–170 cm−1) for the 143-cm−1 Anatase Band as a Function of Excitation Wavelength

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