Abstract

Raman spectroscopy can be used to characterize the rutile/anatase phase composition of TiO2 layers in all-dielectric filters and reflectors of arbitrary design. No special specimen preparation is necessary. Interference effects can enhance Raman scattering compared to single-layer coatings of the same total TiO2 thickness.

© 1984 Optical Society of America

Full Article  |  PDF Article
Related Articles
Structural characterization of TiO2 optical coatings by Raman spectroscopy

W. T. Pawlewicz, G. J. Exarhos, and W. E. Conaway
Appl. Opt. 22(12) 1837-1840 (1983)

Interference-enhanced Raman scattering from TiO2/SiO2 multilayers: measurement and theory

Richard A. Craig, Gregory J. Exarhos, Walter T. Pawlewicz, and Ralph E. Williford
Appl. Opt. 26(19) 4193-4197 (1987)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription