Abstract

Some theoretical considerations and experimental techniques in application of an ADP 45° X-cut four-crystal electrooptic modulator (EOM) to fast retardation modulation ellipsometry are described, emphasis being placed on the thermal stabilization. First to solve the thermal instability problem and to analyze systematic errors resulting from use of the EOM, the Jones matrix for the EOM is theoretically constructed which includes the effect of axial misalignment of the ADP crystals, multiple reflection at crystal-matching-dielectric liquid interfaces, temperature differences among the four crystals, and modulator cell windows. As a result, temperature-dependent factors in EOM characteristics are made clear. Second, a practical matrix form of the Jones matrix is determined from experiments on the bias-voltage dependence of the transmitted light intensity. Last, a thermal stabilization technique introduced by the matrix representation is demonstrated in the application of the EOM to ellipsometry, which enables us to obtain ellipsometric parameters of a sample, (Ψ,Δ), independent of the thermal drift and imperfections that accompany the EOM.

© 1983 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (7)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (47)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription