Determination of optical properties of absorbing materials: a generalized scheme

C. L. Nagendra; G. K. M. Thutupalli

doi:10.1364/AO.22.000587

Applied Optics
Vol. 22,
Issue 4,
pp. 587-591
(1983)
•https://doi.org/10.1364/AO.22.000587

Determination of optical properties of absorbing materials: a generalized scheme

C. L. Nagendra and G. K. M. Thutupalli

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C. L. Nagendra and G. K. M. Thutupalli, "Determination of optical properties of absorbing materials: a generalized scheme," Appl. Opt. 22, 587-591 (1983)

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Abstract

A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of specimen preparation and the method of measurement allow the specimen to be free from surface layers and at the same time account for possible effects of surface roughness. It can be applied to a wide variety of materials regardless of their surface conditions and is particularly useful for metals.

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Sl. no.	Method	Type of reflectance measurement	Accuracy (absolute values)			Constraints	Applicability
Sl. no.	Method	Type of reflectance measurement	Δn	Δk		Constraints	Applicability
1.	Kramers-Kronig analysis	Bare specimen reflectance	?	?		Extrapolation should be well established for the particular material	A,E
2.	Humphreys-Owen methods9	Bare specimen reflectance at different angles of incidence and for different states of polarization		<0.02	>1.0	Evaluation procedure is approximate
			0.05–0.15	for k
				<0.5	<1.0	Restricted to only a narrow band of spectrum where reflectance measurements for different states of polarization are reliable	A,F
3.	Vincent-Geisse method10	Reflectance from bare specimen and specimen overcoated with transparent layers.		<0.1	>0.4	One of the thickness should be twice that of the other	A,G
			0.15–0.20	for k		Thickness should be determined accurately by some other method
				<0.2	<0.4
4.	Tomlin’s method8	Reflectance from bare specimen and specimen overcoated with transparent layers		<0.1	>0.4	n₁ should be as high as possible	A,G
			0.05–0.08	for k
				<0.2	<0.4
5.	NT Method (a)5	Reflectance from bare specimen and specimen overcoated with transparent layers		<0.1	>0.4	n₁ should be as high as possible	A,B,G
			0.05–0.08	for k
				<0.2	<0.4	d₁/d₂ ≈ 1.5
6.	NT Method (b)6	Reflectance from specimen coated with transparent layer(s) only	0.05		0.15	$1.2 \leq {n^{*}}_{2} / n_{1} \leq 1.6$	A,C,G
						$1.75 \leq n / {n^{*}}_{2} \leq 3.0$
7.	Present method	Reflectance from specimen coated with transparent layer(s) only	0.01–0.05		0.05–0.1	2.0 ≤ n/n₁ ≤ 3.0	A to H
						d₂/d₁ ≈ 1.6–1.8

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Applied Optics