Abstract

A previously reported optical guided-wave method for determining the optical constants of high-index thin films has been used to measure the temperature-dependent dispersion in vacuum-evaporated cadmium sulfide thin films. Measurements were carried out over the spectral range from 4579 to 6328 Å using Ar and He–Ne lasers at 18 K, 83 K, and room temperature in an optical cryostat.

© 1983 Optical Society of America

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References

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  1. K. Sasaki, H. Takahashi, Y. Kudo, N. Suzuki, Appl. Opt. 19, 3018 (1980).
    [CrossRef] [PubMed]
  2. K. Sasaki, Y. Kudo, H. Watanabe, O. Hamano, Appl. Opt. 20, 3715 (1981).
    [CrossRef] [PubMed]
  3. K. Sasaki, Y. Kudo, A. Fukuda, H. Awata, O. Hamano, Appl. Opt. 21, 3552 (1982).
    [CrossRef] [PubMed]
  4. J. Gottesman, W. F. C. Ferguson, J. Opt. Soc. Am. 44, 368 (1954).
    [CrossRef]
  5. D. W. Langer, J. Appl. Phys. 37, 3530 (1966).
    [CrossRef]
  6. H. Gobrecht, A. Bartschat, Z. Phys. 156, 131 (1959).
    [CrossRef]
  7. N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).
  8. D. Dutton, Phys. Rev. 112, 758 (1958).
    [CrossRef]
  9. K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.
  10. M. Cardona, G. Harbeke, Phys. Rev. 137, 1467 (1965).
    [CrossRef]

1982 (1)

1981 (1)

1980 (1)

1968 (1)

N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).

1966 (1)

D. W. Langer, J. Appl. Phys. 37, 3530 (1966).
[CrossRef]

1965 (1)

M. Cardona, G. Harbeke, Phys. Rev. 137, 1467 (1965).
[CrossRef]

1959 (1)

H. Gobrecht, A. Bartschat, Z. Phys. 156, 131 (1959).
[CrossRef]

1958 (1)

D. Dutton, Phys. Rev. 112, 758 (1958).
[CrossRef]

1954 (1)

Awata, H.

Bartschat, A.

H. Gobrecht, A. Bartschat, Z. Phys. 156, 131 (1959).
[CrossRef]

Cardona, M.

M. Cardona, G. Harbeke, Phys. Rev. 137, 1467 (1965).
[CrossRef]

Dutton, D.

D. Dutton, Phys. Rev. 112, 758 (1958).
[CrossRef]

Ferguson, W. F. C.

Fukuda, A.

Gobrecht, H.

H. Gobrecht, A. Bartschat, Z. Phys. 156, 131 (1959).
[CrossRef]

Gottesman, J.

Gudymenko, L. F.

N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).

Hamano, O.

K. Sasaki, Y. Kudo, A. Fukuda, H. Awata, O. Hamano, Appl. Opt. 21, 3552 (1982).
[CrossRef] [PubMed]

K. Sasaki, Y. Kudo, H. Watanabe, O. Hamano, Appl. Opt. 20, 3715 (1981).
[CrossRef] [PubMed]

K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.

Harbeke, G.

M. Cardona, G. Harbeke, Phys. Rev. 137, 1467 (1965).
[CrossRef]

Kudo, Y.

Langer, D. W.

D. W. Langer, J. Appl. Phys. 37, 3530 (1966).
[CrossRef]

Maznichenko, A. F.

N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).

Nonaka, O.

K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.

Sasaki, K.

K. Sasaki, Y. Kudo, A. Fukuda, H. Awata, O. Hamano, Appl. Opt. 21, 3552 (1982).
[CrossRef] [PubMed]

K. Sasaki, Y. Kudo, H. Watanabe, O. Hamano, Appl. Opt. 20, 3715 (1981).
[CrossRef] [PubMed]

K. Sasaki, H. Takahashi, Y. Kudo, N. Suzuki, Appl. Opt. 19, 3018 (1980).
[CrossRef] [PubMed]

K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.

Shimizu, T.

K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.

Suzuki, N.

Takahashi, H.

Vitrikhovskii, N. I.

N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).

Watanabe, H.

Appl. Opt. (3)

J. Appl. Phys. (1)

D. W. Langer, J. Appl. Phys. 37, 3530 (1966).
[CrossRef]

J. Opt. Soc. Am. (1)

Phys. Rev. (2)

D. Dutton, Phys. Rev. 112, 758 (1958).
[CrossRef]

M. Cardona, G. Harbeke, Phys. Rev. 137, 1467 (1965).
[CrossRef]

Sov. Phys. Semicond. (1)

N. I. Vitrikhovskii, L. F. Gudymenko, A. F. Maznichenko, Sov. Phys. Semicond. 2, 732 (1968).

Z. Phys. (1)

H. Gobrecht, A. Bartschat, Z. Phys. 156, 131 (1959).
[CrossRef]

Other (1)

K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis, Paris, 7–10 June 1983, paper F26.

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Figures (6)

Fig. 1
Fig. 1

X-ray analysis pattern of vacuum-evaporated CdS thin film.

Fig. 2
Fig. 2

Experimental setup: 1, Ar and He–Ne lasers; 2, quarterwave plate; 3, polarizer; 4, focusing lens; 5, mirror; 6, vertically moving mirror; 7, coupling mirror; 8, cryostat; 9, photodetector; 10, pen recorder; 11, thermocouple (KP vs Au–6Fe), 12, thermometer; 13, fused quartz substrate; 14, Corning 7059 slab-type waveguide; 15, tapered CdS thin film; 16, prism; 17, analyzer.

Fig. 3
Fig. 3

Thickness-dependent oscillatory damping curves with thin film profile (λ = 5145 Å, TE wave).

Fig. 4
Fig. 4

Temperature dependence of refractive index of CdS thin film (TE wave; ordinary).

Fig. 5
Fig. 5

Temperature dependence of absorption coefficient of CdS thin film (TE wave; ordinary).

Fig. 6
Fig. 6

Anisotropic dispersion of CdS thin film (at room temperature).

Equations (2)

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n 2 = ( m λ / 2 d 0 m ) 2 + ( β 0 / k 0 ) 2 ,
ɛ = ɛ ¯ o [ ɛ e 0 0 0 ɛ o 0 0 0 ɛ o ] ,

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