Abstract

The transmittance of aggregated copper films at different stages of oxidation in air have been measured in the 250–2500-nm wavelength range. The electron micrographs displayed an almost continuous structure of the films; the electron diffraction analysis shows these films are composed of Cu and Cu2O. These transmittances agree qualitatively with computated values based on the Bruggeman theory considering the films as a random mixture of Cu, Cu2O, and air.

© 1983 Optical Society of America

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