Abstract

A new technique for determining the IR optical constants of materials that can be formed into thin films is presented. At a given wavelength the thickness of the film t, the index of refraction n, and the extinction coefficient k combine to produce interference effects in the film, which in turn control reflectance from the film. When reflectance is plotted vs thickness the resultant curve is a unique function of n and k. Values of n and k are determined by curve fitting. The technique is illustrated using thin films of muscovite mica, and values of n and k are reported for wave numbers from 1200 to 400 cm−1, which include the reststrahlen region of mica.

© 1983 Optical Society of America

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