Abstract

It is demonstrated that the transverse differential interference method is used as a reliable profiling technique for distributed-index rod lenses, and its accuracy and spatial resolution have been made clear. By the use of this technique the index profile of a distributed-index planar microlens which has 3-D index distribution has been measured.

© 1982 Optical Society of America

Refractive-index profile measurement of preform rods by a transverse differential interferogram

Yasuo Kokubun and Kenichi Iga
Appl. Opt. 19(6) 846-851 (1980)

Evaluation and reduction of aberrations in distributed-index lenses: a review

Kenichi Iga
Appl. Opt. 21(6) 1024-1029 (1982)

Ray traces in a distributed-index planar microlens

Kenichi Iga, Masahiro Oikawa, and Junichi Banno
Appl. Opt. 21(19) 3451-3455 (1982)

Refractive-index profiling of preform rods by a photoelastic method: application to VAD single-mode fiber preforms

N. Shibata, Masao Kawachi, and Takao Edahiro
Appl. Opt. 21(19) 3507-3510 (1982)

Distributed-index planar microlens

M. Oikawa and K. Iga
Appl. Opt. 21(6) 1052-1056 (1982)