It is shown that by using the conical diffraction mount existing echelle gratings can be used at grazing incidence to achieve high spectral resolution in the extreme UV and soft x rays. Design considerations for grazing incidence echelle spectrographs are examined, and two sample designs are discussed. The first, for use in the extreme UV has a primary mirror and an entrance slit to the spectrograph. The system has resolution of 104, operates at any wavelength longward of 100 Å, and covers 30% of the spectrum at a single setting. The x-ray spectrograph uses objective gratings to obtain spectral resolution of 2.8 × 104 over any factor of 2 in wavelength. It operates to wavelengths as short as 4 Å.
© 1982 Optical Society of AmericaFull Article | PDF Article
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