Abstract

An active–passive mode-locked Nd:YAG oscillator provides greatly improved shot-to-shot reproducibility compared with passive mode-locking. Effects of modulator drive power, laser cavity length, and intracavity etalons on the pulse width and stability are given. Using two-photon-fluorescence techniques the pulse width was 35.9 ± 1.7 psec and the corresponding pulse energy was 166 ± 6 μJ.

© 1982 Optical Society of America

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  1. M. A. Lewis, J. T. Knudtson, Chem. Phys. 55, 73 (1981).
    [CrossRef]
  2. R. W. Wilbrandt, H. Weber, IEEE J. Quantum Electron. QE-11, 186 (1975).
    [CrossRef]
  3. H. Vanherzeele, J. L. Van Eck, A. E. Siegman, Appl. Opt. 20, 3484 (1981).
    [CrossRef] [PubMed]
  4. K. Choi, M. R. Topp, J. Opt. Soc. Am. 71, 520 (1981).
    [CrossRef]
  5. J. E. Murray, D. J. Kuizenga, Appl. Phys. Lett. 37, 27 (1980).
    [CrossRef]
  6. D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
    [CrossRef]
  7. D. J. Kuizenga, Opt. Commun. 22, 156 (1977).
    [CrossRef]
  8. I. V. Tomov, R. Fedosejevs, M. C. Richardson, Opt. Commun. 21, 327 (1977).
    [CrossRef]
  9. I. V. Tomov, R. Fedosejevs, M. C. Richardson, Appl. Phys. Lett. 30, 164 (1977).
    [CrossRef]
  10. A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
    [CrossRef]
  11. W. Seka, J. Bunkenburg, J. Appl. Phys. 49, 2277 (1978); see also G. F. Albrecht, J. Bunkenburg, Opt. Commun. 38, 377 (1981).
    [CrossRef]
  12. We thank M. Sceats for important initial discussions.
  13. S. M. George, C. B. Harris, Rev. Sci. Instrum. 52, 852 (1981).
    [CrossRef]
  14. Intra Action Corp., 3719 Warren Ave., Bellwood, Ill. 60104.
  15. G. T. Harvey, C. W. Gabel, G. Mourou, Opt. Commun. 36, 213 (1981).
    [CrossRef]
  16. H. Graener, A. Laubereau, Opt. Commun. 37, 138 (1981).
    [CrossRef]

1981 (6)

H. Vanherzeele, J. L. Van Eck, A. E. Siegman, Appl. Opt. 20, 3484 (1981).
[CrossRef] [PubMed]

K. Choi, M. R. Topp, J. Opt. Soc. Am. 71, 520 (1981).
[CrossRef]

M. A. Lewis, J. T. Knudtson, Chem. Phys. 55, 73 (1981).
[CrossRef]

S. M. George, C. B. Harris, Rev. Sci. Instrum. 52, 852 (1981).
[CrossRef]

G. T. Harvey, C. W. Gabel, G. Mourou, Opt. Commun. 36, 213 (1981).
[CrossRef]

H. Graener, A. Laubereau, Opt. Commun. 37, 138 (1981).
[CrossRef]

1980 (1)

J. E. Murray, D. J. Kuizenga, Appl. Phys. Lett. 37, 27 (1980).
[CrossRef]

1978 (2)

A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
[CrossRef]

W. Seka, J. Bunkenburg, J. Appl. Phys. 49, 2277 (1978); see also G. F. Albrecht, J. Bunkenburg, Opt. Commun. 38, 377 (1981).
[CrossRef]

1977 (3)

D. J. Kuizenga, Opt. Commun. 22, 156 (1977).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Opt. Commun. 21, 327 (1977).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Appl. Phys. Lett. 30, 164 (1977).
[CrossRef]

1975 (1)

R. W. Wilbrandt, H. Weber, IEEE J. Quantum Electron. QE-11, 186 (1975).
[CrossRef]

1973 (1)

D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
[CrossRef]

Bunkenburg, J.

W. Seka, J. Bunkenburg, J. Appl. Phys. 49, 2277 (1978); see also G. F. Albrecht, J. Bunkenburg, Opt. Commun. 38, 377 (1981).
[CrossRef]

Choi, K.

Duerinckx, A. J.

A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
[CrossRef]

Fedosejevs, R.

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Opt. Commun. 21, 327 (1977).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Appl. Phys. Lett. 30, 164 (1977).
[CrossRef]

Gabel, C. W.

G. T. Harvey, C. W. Gabel, G. Mourou, Opt. Commun. 36, 213 (1981).
[CrossRef]

George, S. M.

S. M. George, C. B. Harris, Rev. Sci. Instrum. 52, 852 (1981).
[CrossRef]

Graener, H.

H. Graener, A. Laubereau, Opt. Commun. 37, 138 (1981).
[CrossRef]

Harris, C. B.

S. M. George, C. B. Harris, Rev. Sci. Instrum. 52, 852 (1981).
[CrossRef]

Harvey, G. T.

G. T. Harvey, C. W. Gabel, G. Mourou, Opt. Commun. 36, 213 (1981).
[CrossRef]

Knudtson, J. T.

M. A. Lewis, J. T. Knudtson, Chem. Phys. 55, 73 (1981).
[CrossRef]

Kuizenga, D. J.

J. E. Murray, D. J. Kuizenga, Appl. Phys. Lett. 37, 27 (1980).
[CrossRef]

D. J. Kuizenga, Opt. Commun. 22, 156 (1977).
[CrossRef]

D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
[CrossRef]

Laubereau, A.

H. Graener, A. Laubereau, Opt. Commun. 37, 138 (1981).
[CrossRef]

Lewis, M. A.

M. A. Lewis, J. T. Knudtson, Chem. Phys. 55, 73 (1981).
[CrossRef]

Lund, T.

D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
[CrossRef]

Mourou, G.

G. T. Harvey, C. W. Gabel, G. Mourou, Opt. Commun. 36, 213 (1981).
[CrossRef]

Murray, J. E.

J. E. Murray, D. J. Kuizenga, Appl. Phys. Lett. 37, 27 (1980).
[CrossRef]

Phillion, D. W.

D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
[CrossRef]

Richardson, M. C.

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Appl. Phys. Lett. 30, 164 (1977).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Opt. Commun. 21, 327 (1977).
[CrossRef]

Seka, W.

W. Seka, J. Bunkenburg, J. Appl. Phys. 49, 2277 (1978); see also G. F. Albrecht, J. Bunkenburg, Opt. Commun. 38, 377 (1981).
[CrossRef]

Siegman, A. E.

H. Vanherzeele, J. L. Van Eck, A. E. Siegman, Appl. Opt. 20, 3484 (1981).
[CrossRef] [PubMed]

A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
[CrossRef]

D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
[CrossRef]

Tomov, I. V.

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Opt. Commun. 21, 327 (1977).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Appl. Phys. Lett. 30, 164 (1977).
[CrossRef]

Topp, M. R.

Van Eck, J.

A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
[CrossRef]

Van Eck, J. L.

Vanherzeele, H.

Vanherzeele, H. A.

A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
[CrossRef]

Weber, H.

R. W. Wilbrandt, H. Weber, IEEE J. Quantum Electron. QE-11, 186 (1975).
[CrossRef]

Wilbrandt, R. W.

R. W. Wilbrandt, H. Weber, IEEE J. Quantum Electron. QE-11, 186 (1975).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (2)

J. E. Murray, D. J. Kuizenga, Appl. Phys. Lett. 37, 27 (1980).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Appl. Phys. Lett. 30, 164 (1977).
[CrossRef]

Chem. Phys. (1)

M. A. Lewis, J. T. Knudtson, Chem. Phys. 55, 73 (1981).
[CrossRef]

IEEE J. Quantum Electron. (2)

R. W. Wilbrandt, H. Weber, IEEE J. Quantum Electron. QE-11, 186 (1975).
[CrossRef]

A. J. Duerinckx, H. A. Vanherzeele, J. Van Eck, A. E. Siegman, IEEE J. Quantum Electron. QE-14, 983 (1978).
[CrossRef]

J. Appl. Phys. (1)

W. Seka, J. Bunkenburg, J. Appl. Phys. 49, 2277 (1978); see also G. F. Albrecht, J. Bunkenburg, Opt. Commun. 38, 377 (1981).
[CrossRef]

J. Opt. Soc. Am. (1)

Opt. Commun. (5)

D. J. Kuizenga, D. W. Phillion, T. Lund, A. E. Siegman, Opt. Commun. 9, 221 (1973).
[CrossRef]

D. J. Kuizenga, Opt. Commun. 22, 156 (1977).
[CrossRef]

I. V. Tomov, R. Fedosejevs, M. C. Richardson, Opt. Commun. 21, 327 (1977).
[CrossRef]

G. T. Harvey, C. W. Gabel, G. Mourou, Opt. Commun. 36, 213 (1981).
[CrossRef]

H. Graener, A. Laubereau, Opt. Commun. 37, 138 (1981).
[CrossRef]

Rev. Sci. Instrum. (1)

S. M. George, C. B. Harris, Rev. Sci. Instrum. 52, 852 (1981).
[CrossRef]

Other (2)

Intra Action Corp., 3719 Warren Ave., Bellwood, Ill. 60104.

We thank M. Sceats for important initial discussions.

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Figures (3)

Fig. 1
Fig. 1

Acoustic resonances of the modulator. The inset shows the resonances around 61.96 MHz in expanded scale.

Fig. 2
Fig. 2

(A) TPF trace from the triangular apparatus and (B) TPF trace from a single-mirror apparatus.

Fig. 3
Fig. 3

(A) Pulse-train peak amplitude vs oscillator cavity length and (B) pulse width vs oscillator cavity length.

Tables (2)

Tables Icon

Table I Pulse Width as Function of Radio-Frequency Power

Tables Icon

Table II Pulse Widths for Three Etalon Thicknesses

Metrics