Abstract

A method of extending the silicon photodiode absolute spectral response self-calibration techniques to nonlaser wavelengths using a tungsten source filtered with narrow well-characterized interference filters is described. Results are presented for comparisons of two photodiodes self-calibrated with a laser source and for comparisons of two photodiodes self-calibrated with the filtered tungsten source. Results of the photodiode self-calibration with filtered tungsten radiation were verified by comparisons with a spectrally flat pyroelectric radiometer calibrated in terms of the self-calibration of photodiodes at the He–Ne laser wavelength. These data show that the method can be used to establish an absolute spectral response scale, from 0.400 to 0.800 μm, with an uncertainty of better than ±1.0%. The scale realized by the self-calibration method is independent of lamp standards and blackbody detectors. The method can be used in any moderately equipped laboratory.

© 1982 Optical Society of America

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References

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  1. J. Geist, Appl. Opt. 18, 760 (1979).
    [CrossRef] [PubMed]
  2. E. F. Zalewski, J. Geist, Appl. Opt. 19, 1214 (1980).
    [CrossRef] [PubMed]
  3. References to specific manufacturers do not constitute endorsement but are given to describe adequately the experiment.
  4. J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

1980

1979

J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

J. Geist, Appl. Opt. 18, 760 (1979).
[CrossRef] [PubMed]

Fowler, J. B.

J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

Geist, J.

Lind, M. A.

J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

Zalewski, E. F.

E. F. Zalewski, J. Geist, Appl. Opt. 19, 1214 (1980).
[CrossRef] [PubMed]

J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

Appl. Opt.

Natl. Bur. Stand. U.S. Tech. Note 987

J. B. Fowler, M. A. Lind, E. F. Zalewski, Natl. Bur. Stand. U.S. Tech. Note 987 (1979).

Other

References to specific manufacturers do not constitute endorsement but are given to describe adequately the experiment.

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Figures (2)

Fig. 1
Fig. 1

Optical system for filtered tungsten source: LH, lamp housing, filament focused on A1, 2.5-mm aperture; L1, collimating lens; WF, water filter; A2,A3, 15-mm apertures; F,F, blocking and interference filters; SH, shutter; CH, chopper on transverse slide; A4, iris diaphragm; L2, focusing lens; RP, experimental reference plane; M1, mirror inserted to deflect radiation downward to photodiode surface; PD, bias measurements.

Fig. 2
Fig. 2

Goniometer for measurement of photodiode specular reflectance: S, radiation source; PD, photodiode in mount at rotation axis of index table IT; L1, lens–detector combination, UV444B with 44-mm f1, 38-mm diam lens.

Tables (3)

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Table I Comparison of Two Silicon Photodiode Self-Calibrations used to Calibrate an ESPR at 0.63299 μm

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Table II Comparison of Radiant Power Measurements of a Filtered Tungsten Source made with a Self-Calibrated Silicon Photodiode and with a ESPR

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Table III Comparison of Radiant Power Measurements made with two Silicon Photodiodes Self-Calibrated with a Filtered Tungsten Source (0.400–0.800 μm)

Equations (2)

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R ( λ ) = [ 1 ρ ( λ ) ] ( λ ) λ / K
R ( λ ) = O R A ( 1 ρ 5 ° ) ( R 0 ° / R 5 ° ) ( λ / K ) .

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