Abstract

Using holographic matched filtering and electronic processing, small variations in surface displacement along the seam of a hermetic microcircuit package can be detected when the seam is stressed. Destructive analysis of a solder-sealed package reveals a strong correlation between optical signal variations and nonuniformity of solder adhesion and wetting along the seam. The technique promises potential application as a means of nondestructively inspecting for flaws in small welded or soldered seams.

© 1981 Optical Society of America

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