Abstract

A technique is presented to determine surface contours of 3-D objects by laser speckle interferometry. A double exposure specklegram is recorded by giving the object a small tilt between exposures. Surface contours are obtained by Fourier filtering of the specklegram.

© 1981 Optical Society of America

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References

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  1. P. S. Theocaris, Moire Fringes in Strain Analysis (Pergamon, New York, 1969).
  2. D. M. Meadows, W. O. Johnson, J. B. Allen, Appl. Opt. 9, 942 (1970).
    [CrossRef] [PubMed]
  3. R. K. Erf, Ed., Holographic Nondestructive Testing (Academic, New York, 1974).
  4. Y. Y. Hung et al., Appl. Opt. 17, 128 (1978).
    [CrossRef] [PubMed]
  5. J. N. Butters, J. A. Leendertz, “Advances in Electro Optic Techniques and Lasers for Engineering Metrology,” in Proceedings Electro Optics International Conference, Brighton (1974).
  6. G. Jaisingh, F. P. Chiang, “Subjective Speckle Movement,” IEEE–SESA Joint Conference, North Falmouth, Mass. (1980).
  7. P. Jacquot, P. K. Rastogi, Appl. Opt. 18, 2022 (1979).
    [CrossRef] [PubMed]
  8. P. R. Khetan, F. P. Chiang, Appl. Opt. 15, 2205 (1976).
    [CrossRef] [PubMed]

1979 (1)

1978 (1)

1976 (1)

1970 (1)

Allen, J. B.

Butters, J. N.

J. N. Butters, J. A. Leendertz, “Advances in Electro Optic Techniques and Lasers for Engineering Metrology,” in Proceedings Electro Optics International Conference, Brighton (1974).

Chiang, F. P.

P. R. Khetan, F. P. Chiang, Appl. Opt. 15, 2205 (1976).
[CrossRef] [PubMed]

G. Jaisingh, F. P. Chiang, “Subjective Speckle Movement,” IEEE–SESA Joint Conference, North Falmouth, Mass. (1980).

Hung, Y. Y.

Jacquot, P.

Jaisingh, G.

G. Jaisingh, F. P. Chiang, “Subjective Speckle Movement,” IEEE–SESA Joint Conference, North Falmouth, Mass. (1980).

Johnson, W. O.

Khetan, P. R.

Leendertz, J. A.

J. N. Butters, J. A. Leendertz, “Advances in Electro Optic Techniques and Lasers for Engineering Metrology,” in Proceedings Electro Optics International Conference, Brighton (1974).

Meadows, D. M.

Rastogi, P. K.

Theocaris, P. S.

P. S. Theocaris, Moire Fringes in Strain Analysis (Pergamon, New York, 1969).

Appl. Opt. (4)

Other (4)

P. S. Theocaris, Moire Fringes in Strain Analysis (Pergamon, New York, 1969).

R. K. Erf, Ed., Holographic Nondestructive Testing (Academic, New York, 1974).

J. N. Butters, J. A. Leendertz, “Advances in Electro Optic Techniques and Lasers for Engineering Metrology,” in Proceedings Electro Optics International Conference, Brighton (1974).

G. Jaisingh, F. P. Chiang, “Subjective Speckle Movement,” IEEE–SESA Joint Conference, North Falmouth, Mass. (1980).

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Figures (5)

Fig. 1
Fig. 1

Geometry of speckle movement for contouring study.

Fig. 2
Fig. 2

Schematic of whole-field filtering.

Fig. 3
Fig. 3

Schematic of experimental setup.

Fig. 4
Fig. 4

Surface contours of a 5-cm diam sphere.

Fig. 5
Fig. 5

Surface contours of a light bulb.

Equations (10)

Equations on this page are rendered with MathJax. Learn more.

δ 1 = P P cos α + P P 1 ,
δ 1 = R ϕ cos α + h ϕ .
δ ψ = D S cos θ 2 cos ψ + ϕ ( cos θ cos ψ ) ,
δ ψ ϕ .
δ 2 = h ϕ .
U = M ( 2 h ϕ + R ϕ cos α ) ,
cos α D - h R ,
U = M ϕ ( 2 h + D - h ) , = M ϕ h + M ϕ D .
( M ϕ h + M ϕ D ) n + 1 - ( M ϕ h + M ϕ D ) n = λ f A ,
M ϕ ( h n + 1 - h n ) = λ f A ,

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