Abstract

The dielectric function = 1 + i∊2 has been determined for Al2O3 films prepared by electron beam evaporation, in the 5–50-μm wavelength range. The data were extracted from spectrophotometric recordings of transmittance and reflectance by use of a novel technique. Supplementary measurements were made of the refractive index for visible and near-infrared wavelengths and of the dielectric constant at 1 MHz. Kramers-Kronig analysis was employed to check the consistency of our results for 1 and 2.

© 1981 Optical Society of America

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