Abstract

Mouchart’s theory of the buffer layer is reformulated in terms of internal antireflection and extended to general dielectric/metallic media. The all-dielectric case is then studied in oblique incidence as a means of depolarizing partial reflectors. Several procedures are indicated for the construction of buffering stacks which, when coupled with germinal stacks, balance out their p and s reflections at the given level. Examples of depolarized half-mirrors are presented. A novel version of the Argand diagram for thin films in oblique incidence is introduced during the analysis.

© 1981 Optical Society of America

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