A new white light shear interferometer based on the use of superposition fringes is described (superposition fringe shear interferometer, SFSI). The SFSI enables one to test for plane waves; chromatic as well as all other aberrations can be measured. Test examples and the secondary spectrum of a microscope objective are given. By spectroscopically dispersing a slit section of the shear interferogram the chromatic aberrations can be displayed. The mean phase difference between the two interfering waves can be adjusted by tilting one of the two interferometer etalons. The whole setup is mechanically stable. Shear interferograms can be obtained by inserting an interference filter in the ray path.
© 1980 Optical Society of America
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