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References

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  1. D. Gerstenberg, in Handbook of Thin Film Technology, L. Maissel, R. Glang, Eds. (McGraw-Hill, New York, 1970), Chap. 9.
  2. S. Refermat, U. Rochester; private communication.
  3. O. Arnon, P. Baumeister, Appl. Opt. 17, 2913 (1978).
    [Crossref] [PubMed]
  4. E. E. Khawaja, S. G. Tomlin, Thin Solid Films 30, 361 (1975).
    [Crossref]
  5. D. A. Vermilyea, Acta Metall. 1, 282 (1953).
    [Crossref]
  6. J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
    [Crossref]
  7. L. Young, Proc. R. Soc. London Ser A: 244, 41 (1958).
    [Crossref]
  8. D. Smith, P. Baumeister, Appl. Opt. 18, 111 (1979).
    [Crossref] [PubMed]
  9. F. Abeles, in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1963), Vol. 2.
    [Crossref]

1979 (1)

1978 (1)

1975 (1)

E. E. Khawaja, S. G. Tomlin, Thin Solid Films 30, 361 (1975).
[Crossref]

1958 (1)

L. Young, Proc. R. Soc. London Ser A: 244, 41 (1958).
[Crossref]

1953 (1)

D. A. Vermilyea, Acta Metall. 1, 282 (1953).
[Crossref]

1952 (1)

J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
[Crossref]

Abeles, F.

F. Abeles, in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1963), Vol. 2.
[Crossref]

Arnon, O.

Baumeister, P.

Gerstenberg, D.

D. Gerstenberg, in Handbook of Thin Film Technology, L. Maissel, R. Glang, Eds. (McGraw-Hill, New York, 1970), Chap. 9.

Khawaja, E. E.

E. E. Khawaja, S. G. Tomlin, Thin Solid Films 30, 361 (1975).
[Crossref]

Refermat, S.

S. Refermat, U. Rochester; private communication.

Smith, D.

Sturdy, G. E.

J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
[Crossref]

Tipton, C. R.

J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
[Crossref]

Tomlin, S. G.

E. E. Khawaja, S. G. Tomlin, Thin Solid Films 30, 361 (1975).
[Crossref]

Vermilyea, D. A.

D. A. Vermilyea, Acta Metall. 1, 282 (1953).
[Crossref]

Waber, J. T.

J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
[Crossref]

Wise, E. M.

J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
[Crossref]

Young, L.

L. Young, Proc. R. Soc. London Ser A: 244, 41 (1958).
[Crossref]

Acta Metall. (1)

D. A. Vermilyea, Acta Metall. 1, 282 (1953).
[Crossref]

Appl. Opt. (2)

J. Electrochem. Soc. (1)

J. T. Waber, G. E. Sturdy, E. M. Wise, C. R. Tipton, J. Electrochem. Soc. 99, 121 (1952).
[Crossref]

Proc. R. Soc. London Ser A (1)

L. Young, Proc. R. Soc. London Ser A: 244, 41 (1958).
[Crossref]

Thin Solid Films (1)

E. E. Khawaja, S. G. Tomlin, Thin Solid Films 30, 361 (1975).
[Crossref]

Other (3)

D. Gerstenberg, in Handbook of Thin Film Technology, L. Maissel, R. Glang, Eds. (McGraw-Hill, New York, 1970), Chap. 9.

S. Refermat, U. Rochester; private communication.

F. Abeles, in Progress in Optics, E. Wolf, Ed. (North-Holland, Amsterdam, 1963), Vol. 2.
[Crossref]

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Figures (3)

Fig. 1
Fig. 1

Crosses represent the relative radiant reflectance (at a wavelength of 460 nm) vs the cosine of the angle of incidence of a bare substrate of NG-3 glass (curve G) and the same substrate coated with a tantalum pentoxide film (curve H). The smooth curves represent the best least squares fit to the data.

Fig. 2
Fig. 2

Same as in Fig. 1, with the exception that the wavelength is 700 nm.

Fig. 3
Fig. 3

Measured refractive index vs wave number of a tantalum pentoxide film whose optical thickness is ∼150 nm.

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