Abstract

The dielectric function εε1 + 2 of evaporated SiO films is reported for the wavelength region from 8 to 33 μm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for ε and ε2 is verified by the Kramers-Kronig analysis.

© 1980 Optical Society of America

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