Abstract

A new method for surface roughness measurements is described based on the fibrous, roughness-dependent structure of polychromatic speckle patterns in the far field. The patterns are recorded on photographic film and analyzed by an optical Fourier transform system with a double aperture in the film plane. We have calculated the theoretical roughness dependence of a parameter in the Fourier spectrum. Our experimental results agree fairly well with the theory.

© 1979 Optical Society of America

Surface roughness measurement by means of polychromatic speckle elongation

Peter Lehmann, Stefan Patzelt, and Armin Schöne
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Fibrous radial structure of speckle patterns in polychromatic light

Y. Tomita, K. Nakagawa, and T. Asakura
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Aspect ratio of elongated polychromatic far-field speckles of continuous and discrete spectral distribution with respect to surface roughness characterization

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