Abstract

A general computer program was developed to calculate the reflectivity, transmissivity, and absorptivity of nonideal multilayer structure devices. The program allows for error-based variation in layer thicknesses and also for the formation of interfacial layers between the primary layers. The main text of the program consists of the calculation of the matrix elements of the characteristic matrix T for any given two-component layer structure. The treatment is not restricted to any particular range of wavelength, type of material forming the layer structure, or number of layers in the chosen system. The pertinent parameters entering the calculations are the thicknesses of the individual layers (which are permitted to vary randomly within limit of error); the thicknesses of the interfacial layers; the complex indices of refraction of the sub-some strate, the pertinent layers, and the surrounding ambience; and the structural makeup of the layer stacking.

© 1979 Optical Society of America

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