Abstract

Effects of M-center concentration and thickness of the M-center layer on the photosensitive characteristics of optical information storage elements using M centers in NaF crystals are presented. It is shown that writing in the disordering mode and reading with crossed polarizers in white light provide good contrast and gray scale images just like conventional silver halide film.

© 1978 Optical Society of America

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References

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  1. Y. Kishi, I. Imai, T. Yazaki, International Conference on Color Centers in Ionic Crystals, Sendai (1974), abstract 189.
  2. I. Schneider, M. Lehmann, R. Bocker, Appl. Phys. Lett. 25, 77 (1974).
    [CrossRef]
  3. D. Casasent, F. Caimi, Appl. Opt. 15, 815 (1976).
    [CrossRef] [PubMed]
  4. D. Casasent, F. Caimi, J. Appl. Phys. 47, 2371 (1976).
    [CrossRef]
  5. D. Casasent, F. Caimi, Appl. Phys. Lett. 29, 660 (1976).
    [CrossRef]
  6. T. Yazaki, T. Imai, Y. Kishi, Izv. Akad. Nauk SSSR Ser. Fiz. 41, 727 (1977).
  7. G. E. Scrivener, M. R. Tubbs, Opt. Commun. 10, 32 (1974).
    [CrossRef]

1977

T. Yazaki, T. Imai, Y. Kishi, Izv. Akad. Nauk SSSR Ser. Fiz. 41, 727 (1977).

1976

D. Casasent, F. Caimi, J. Appl. Phys. 47, 2371 (1976).
[CrossRef]

D. Casasent, F. Caimi, Appl. Phys. Lett. 29, 660 (1976).
[CrossRef]

D. Casasent, F. Caimi, Appl. Opt. 15, 815 (1976).
[CrossRef] [PubMed]

1974

G. E. Scrivener, M. R. Tubbs, Opt. Commun. 10, 32 (1974).
[CrossRef]

I. Schneider, M. Lehmann, R. Bocker, Appl. Phys. Lett. 25, 77 (1974).
[CrossRef]

Bocker, R.

I. Schneider, M. Lehmann, R. Bocker, Appl. Phys. Lett. 25, 77 (1974).
[CrossRef]

Caimi, F.

D. Casasent, F. Caimi, Appl. Opt. 15, 815 (1976).
[CrossRef] [PubMed]

D. Casasent, F. Caimi, Appl. Phys. Lett. 29, 660 (1976).
[CrossRef]

D. Casasent, F. Caimi, J. Appl. Phys. 47, 2371 (1976).
[CrossRef]

Casasent, D.

D. Casasent, F. Caimi, J. Appl. Phys. 47, 2371 (1976).
[CrossRef]

D. Casasent, F. Caimi, Appl. Opt. 15, 815 (1976).
[CrossRef] [PubMed]

D. Casasent, F. Caimi, Appl. Phys. Lett. 29, 660 (1976).
[CrossRef]

Imai, I.

Y. Kishi, I. Imai, T. Yazaki, International Conference on Color Centers in Ionic Crystals, Sendai (1974), abstract 189.

Imai, T.

T. Yazaki, T. Imai, Y. Kishi, Izv. Akad. Nauk SSSR Ser. Fiz. 41, 727 (1977).

Kishi, Y.

T. Yazaki, T. Imai, Y. Kishi, Izv. Akad. Nauk SSSR Ser. Fiz. 41, 727 (1977).

Y. Kishi, I. Imai, T. Yazaki, International Conference on Color Centers in Ionic Crystals, Sendai (1974), abstract 189.

Lehmann, M.

I. Schneider, M. Lehmann, R. Bocker, Appl. Phys. Lett. 25, 77 (1974).
[CrossRef]

Schneider, I.

I. Schneider, M. Lehmann, R. Bocker, Appl. Phys. Lett. 25, 77 (1974).
[CrossRef]

Scrivener, G. E.

G. E. Scrivener, M. R. Tubbs, Opt. Commun. 10, 32 (1974).
[CrossRef]

Tubbs, M. R.

G. E. Scrivener, M. R. Tubbs, Opt. Commun. 10, 32 (1974).
[CrossRef]

Yazaki, T.

T. Yazaki, T. Imai, Y. Kishi, Izv. Akad. Nauk SSSR Ser. Fiz. 41, 727 (1977).

Y. Kishi, I. Imai, T. Yazaki, International Conference on Color Centers in Ionic Crystals, Sendai (1974), abstract 189.

Appl. Opt.

Appl. Phys. Lett.

I. Schneider, M. Lehmann, R. Bocker, Appl. Phys. Lett. 25, 77 (1974).
[CrossRef]

D. Casasent, F. Caimi, Appl. Phys. Lett. 29, 660 (1976).
[CrossRef]

Izv. Akad. Nauk SSSR Ser. Fiz.

T. Yazaki, T. Imai, Y. Kishi, Izv. Akad. Nauk SSSR Ser. Fiz. 41, 727 (1977).

J. Appl. Phys.

D. Casasent, F. Caimi, J. Appl. Phys. 47, 2371 (1976).
[CrossRef]

Opt. Commun.

G. E. Scrivener, M. R. Tubbs, Opt. Commun. 10, 32 (1974).
[CrossRef]

Other

Y. Kishi, I. Imai, T. Yazaki, International Conference on Color Centers in Ionic Crystals, Sendai (1974), abstract 189.

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Figures (8)

Fig. 1
Fig. 1

Relative M-center concentration profile as a function of the depth from the surface after coloration with 60-keV, 100-keV, 150-keV, and 200-keV electrons. ○, x, Δ, and • denote 60-keV, 100-keV, 150-keV, and 200-keV electrons, respectively.

Fig. 2
Fig. 2

Experimental arrangement for measuring exposure characteristics of NaF crystal plates in the disordering mode of operation with crossed polarizers.

Fig. 3
Fig. 3

Transmission spectra between crossed polarizers without exposure of 0.01 mole % Mg++ doped NaF crystal samples of fixed M-center layer thickness but different M-center concentrations. Curves 1–7 are for samples with M-center concentrations of 1.2, 2.1, 3.2, 4.9, 6.7, 8.9, and 13 × 1017 centers/cm3.

Fig. 4
Fig. 4

Transmission spectra of the sample with M-center concentration of 1.2 × 1017 centers/cm3 in various stages of exposure. Curves 1–6 are for 0, 44-mJ/cm2, 88-mJ/cm2, 132-mJ/cm2, 176-mJ/cm2, and 264-mJ/cm2 exposures.

Fig. 5
Fig. 5

Transmission spectra of the sample with M-center concentration of 13 × 1017 centers/cm3 in various stages of exposure. Curves 1–10 are for 0, 18-mJ/cm2, 56-mJ/cm2, 113-mJ/cm2, 170-mJ/cm2, 263-mJ/cm2, 350-mJ/cm2, 520-mJ/cm2, 630-mJ/cm2, and 730-mJ/cm2 exposures.

Fig. 6
Fig. 6

Normalized transmission at peak wavelength of the transmission spectra plotted against exposure. Curves 1–3 correspond to the samples with M-center concentrations of 1.2, 4.9, and 13 × 1017 centers/cm3.

Fig. 7
Fig. 7

Dependence of (a) erasing properties and (b) writing properties of the samples in the disordering mode of operation with crossed polarizers on the thickness of the photosensitive layer; •, x, ○, and Δ denotes photosensitive layer thicknesses of 14 μm, 44 μm, 95 μm, and 180 μm.

Fig. 8
Fig. 8

Reconstructed image in white light of images recorded in an NaF crystal plate with noncoherent light with peak output near 365 nm.

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